Reliability: Fallacy or reality?
- González, Antonio
- Mahlke, Scott
- Mukherjee, Shubu
- Sendag, Resit
- Chiou, Derek
- Yi, Joshua J.
Publication date
November 2007
DOI Publisher
Institute of Electrical and Electronics Engineers (IEEE)Abstract
As chip architects and manufacturers plumb ever-smaller process technologies, new species of faults are compromising device reliability. Following an introduction by Antonio González, Scott Mahlke and Shubu Mukherjee debate whether reliability is a legitimate concern for the microarchitect. Topics include the costs of adding reliability versus those of ignoring it, how to measure it, techniques for improving it, and whether consumers really want it. © 2007 IEEE
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