A fault-tolerant associative approach is proposed to be used in on-line repair for highly available memories. The memory repair mechanism is designed similar to a cache memory in its spare to main memory mapping schemes. Four spare memory mapping schemes are presented: fully associative, associative direct, associative set and associative multiple. If cache memory repair is needed, the proposed schemes can also be applied. The repair mechanism consists of a TMR content addressable memory (CAM) and an SEC/DED spare data memory. Although it is sufficient to encode the CAM with SEC code, we find that TMR version is faster in accessing time and more cost-effective. To repair a 1M×32 main memory with eight spare words, the proposed schemes use l...
[[abstract]]There is growing need for embedded memory builtin self-repair (MBISR) due to the introdu...
International audienceWe illustrate that memory repair for high fault rates allows improving yield, ...
[[abstract]]With the fast development pace of deep submicron technology, the size and density of sem...
A fault-tolerant associative approach is proposed to be used in on-line repair for highly available ...
International audienceAssociative memories allow the retrieval of previously stored messages given a...
Abstract—This paper proposes a simple and effective built-in self-repair (BISR) scheme for content a...
For the next computer generation, which may have extensive artificial intelligence properties, the u...
We consider associative memories based on clustered graphs that were recently introduced. These memo...
Associative or content addressable memories can be used for many computing applications. This paper ...
NUMBER OF PAGES: (xliv+1199+x+305 suppl.)In modern SoCs, embedded memories occupy the largest part o...
International audienceWe consider associative memories based on clustered graphs that were recently ...
ISBN: 1581137621In modern SoCs, embedded memories occupy the largest part of the chip area and inclu...
Soft Errors are becoming a major concern for modern computing systems. Memories are one of the eleme...
The memory diagnosis and repair problem [1-12] is related to the tendency of continuous reduction of...
A built-in self repair analyzer with the optimal repair rate for memory arrays with redundancy. The ...
[[abstract]]There is growing need for embedded memory builtin self-repair (MBISR) due to the introdu...
International audienceWe illustrate that memory repair for high fault rates allows improving yield, ...
[[abstract]]With the fast development pace of deep submicron technology, the size and density of sem...
A fault-tolerant associative approach is proposed to be used in on-line repair for highly available ...
International audienceAssociative memories allow the retrieval of previously stored messages given a...
Abstract—This paper proposes a simple and effective built-in self-repair (BISR) scheme for content a...
For the next computer generation, which may have extensive artificial intelligence properties, the u...
We consider associative memories based on clustered graphs that were recently introduced. These memo...
Associative or content addressable memories can be used for many computing applications. This paper ...
NUMBER OF PAGES: (xliv+1199+x+305 suppl.)In modern SoCs, embedded memories occupy the largest part o...
International audienceWe consider associative memories based on clustered graphs that were recently ...
ISBN: 1581137621In modern SoCs, embedded memories occupy the largest part of the chip area and inclu...
Soft Errors are becoming a major concern for modern computing systems. Memories are one of the eleme...
The memory diagnosis and repair problem [1-12] is related to the tendency of continuous reduction of...
A built-in self repair analyzer with the optimal repair rate for memory arrays with redundancy. The ...
[[abstract]]There is growing need for embedded memory builtin self-repair (MBISR) due to the introdu...
International audienceWe illustrate that memory repair for high fault rates allows improving yield, ...
[[abstract]]With the fast development pace of deep submicron technology, the size and density of sem...