Structural and magnetic properties of thin manganite films grown on silicon substrates

Bergenti I.
Dediu V.
Arisi E.
Cavallini M.
Moulin J. F.
Biscarini F.
De Jong M.
Dennis C.
Gregg J.

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Publication date

January 2005

DOI

10.1016/j.progsolidstchem.2005.11.004

Publisher

Elsevier BV

Abstract

Polycrystalline La0.7Sr0.3MnO3 manganite thin films were grown on silicon substrates covered by SiOx amorphous native oxide. Unusual splitting of the manganite layer was found: on the top of an intermediate layer characterised by lower crystalline order, a magnetic robust layer is formed. Curie temperatures of about 325 K were achieved for 70 nm thick films. A strong room temperature XMCD signal was detected indicating high spin polarisation near the surface. © 2005 Elsevier Ltd. All rights reserved

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Structural and magnetic properties of thin manganite films grown on silicon substrates

Abstract

Extracted data

Structural and magnetic properties of thin manganite films grown on silicon substrates

Abstract

Extracted data

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