This dataset can be used to test various analysis methods for high-resolution 4D STEM, including phase contrast methods such as ptychography. Scan and diffraction coordinates have been calibrated. The high scan magnification allows to identify individual atoms and easily distinguish them from reconstruction artifacts. Data was acquired at a probe-corrected FEI Titan 80-300 STEM operated at 300 kV. The microscope was equipped with a Medipix Merlin for EM detector operated at an acquisition rate for individual diffraction patterns of 1 kHz. The scan size was 128 x 128 scan points and the recorded diffraction patterns had a dimension of 256 x 256 pixel. The convergence angle of the incident probe was measured with a polycrystall...
Accurate measurement of defect structures is hindered by complex atomic configuration and/or crystal...
53 pagesThe goal of microscopy is to take position-resolved data of things invisible & small and tra...
Scanning transmission electron microscopy (STEM) allows for imaging, diffraction, and spectroscopy o...
This dataset can be used to test various analysis methods for high-resolution 4D STEM, including pha...
This dataset allows to investigate phase contrast methods for 4D scanning transmission electron micr...
The following 4D-STEM data sets were collected on the ThemIS and TitanX scanning transmission electr...
Four-dimensional scanning transmission electron microscopy (4D-STEM) is a technique where a full two...
recently achieved the first direct image of a crystal at sub-Angstrom resolution, as shown in Fig. 1...
Four-dimensional scanning transmission electron microscopy (4D-STEM) is a technique where a full two...
151 pagesThe development of fast pixelated direct electron detectors allows the collection of full s...
We report the application of focused probe ptychography using binary 4D datasets obtained using scan...
4D-STEM data frequently requires a number of calibrations in order to make accurate measurement: for...
The following 4D-STEM data sets were collected on the ThemIS and TitanX scanning transmission electr...
Unveiling the identity, spatial configuration, and microscopic structure of point defects is one of ...
Scanning Transmission Electron Microscopy (STEM) is a key technique for analyzing crystal structures...
Accurate measurement of defect structures is hindered by complex atomic configuration and/or crystal...
53 pagesThe goal of microscopy is to take position-resolved data of things invisible & small and tra...
Scanning transmission electron microscopy (STEM) allows for imaging, diffraction, and spectroscopy o...
This dataset can be used to test various analysis methods for high-resolution 4D STEM, including pha...
This dataset allows to investigate phase contrast methods for 4D scanning transmission electron micr...
The following 4D-STEM data sets were collected on the ThemIS and TitanX scanning transmission electr...
Four-dimensional scanning transmission electron microscopy (4D-STEM) is a technique where a full two...
recently achieved the first direct image of a crystal at sub-Angstrom resolution, as shown in Fig. 1...
Four-dimensional scanning transmission electron microscopy (4D-STEM) is a technique where a full two...
151 pagesThe development of fast pixelated direct electron detectors allows the collection of full s...
We report the application of focused probe ptychography using binary 4D datasets obtained using scan...
4D-STEM data frequently requires a number of calibrations in order to make accurate measurement: for...
The following 4D-STEM data sets were collected on the ThemIS and TitanX scanning transmission electr...
Unveiling the identity, spatial configuration, and microscopic structure of point defects is one of ...
Scanning Transmission Electron Microscopy (STEM) is a key technique for analyzing crystal structures...
Accurate measurement of defect structures is hindered by complex atomic configuration and/or crystal...
53 pagesThe goal of microscopy is to take position-resolved data of things invisible & small and tra...
Scanning transmission electron microscopy (STEM) allows for imaging, diffraction, and spectroscopy o...