F.Z. and B.J.R. gratefully acknowledge support from the China Scholarship Council and Science Foundation Ireland (US-Ireland R&D Partnership Programme (SFI/14/US/I3113) and Career Development Award (SFI/17/CDA/4637) with support from the Sustainable Energy Authority of Ireland). A.N. gratefully acknowledges support from the Engineering and Physics Sciences Research Council (EPSRC) through grants EP/R023751/1 and EP/L017008/1. A.K. gratefully acknowledges support from Department of Education and Learning NI through grant USI-082 and Engineering and Physical Sciences Research Council via grant EP/S037179/1. K.W., Y.Y., and N.B.G. gratefully acknowledge support from the US National Science Foundation through grant CMMI-1537262 and DMR-1255379....
This thesis focuses on ferroelectric thin film characterization through Piezoresponse Force Microsco...
Relaxor ferroelectrics exhibit a range of interesting material behavior, including high electromecha...
peer-reviewedThe ability to reliably measure electromechanical properties is crucial to the advancem...
Scanning Probe Microscopy (SPM) based techniques probe material properties over microscale regions w...
This repository contains the data and code used in the corresponding study: Maximizing Information: ...
Piezoresponse force microscopy (PFM) is a powerful method widely used for nanoscale studies of the e...
Physical and Chemical Insights into Complex Ferroelectric Oxides Through Machine Learning Approaches...
In this paper, we review recent advances in piezoresponse force microscopy (PFM) with respect to nan...
Relaxor ferroelectrics exhibit a range of interesting material behavior, including high electromecha...
Piezoresponse Force Microscopy: A Window into Electromechanical Behavior at the Nanoscale Piezorespo...
This chapter describes the principles, theoretical background, recent developments, and applications...
There has been tremendous interest in piezoelectricity at the nanoscale, for example in nanowires an...
Thesis (Ph.D.)--University of Washington, 2020Advanced functional materials have revolutionized our ...
Scanning force microscopy has been used to perform a comparative nanoscale study of domain structure...
The domain configurations and piezoelectric coefficient of ferroelectric materials such as PZT and P...
This thesis focuses on ferroelectric thin film characterization through Piezoresponse Force Microsco...
Relaxor ferroelectrics exhibit a range of interesting material behavior, including high electromecha...
peer-reviewedThe ability to reliably measure electromechanical properties is crucial to the advancem...
Scanning Probe Microscopy (SPM) based techniques probe material properties over microscale regions w...
This repository contains the data and code used in the corresponding study: Maximizing Information: ...
Piezoresponse force microscopy (PFM) is a powerful method widely used for nanoscale studies of the e...
Physical and Chemical Insights into Complex Ferroelectric Oxides Through Machine Learning Approaches...
In this paper, we review recent advances in piezoresponse force microscopy (PFM) with respect to nan...
Relaxor ferroelectrics exhibit a range of interesting material behavior, including high electromecha...
Piezoresponse Force Microscopy: A Window into Electromechanical Behavior at the Nanoscale Piezorespo...
This chapter describes the principles, theoretical background, recent developments, and applications...
There has been tremendous interest in piezoelectricity at the nanoscale, for example in nanowires an...
Thesis (Ph.D.)--University of Washington, 2020Advanced functional materials have revolutionized our ...
Scanning force microscopy has been used to perform a comparative nanoscale study of domain structure...
The domain configurations and piezoelectric coefficient of ferroelectric materials such as PZT and P...
This thesis focuses on ferroelectric thin film characterization through Piezoresponse Force Microsco...
Relaxor ferroelectrics exhibit a range of interesting material behavior, including high electromecha...
peer-reviewedThe ability to reliably measure electromechanical properties is crucial to the advancem...