Add to ORKGFlight data on bipolar junction transistors (BJTs) are recorded to characterize the effect of low dose rate (LDR) space irradiation; results are comparable to ground-based LDR and elevated temperature tests. Additionally, Gummel plots of mission data are compared for different device under test (DUT) experiment variables
Purpose: Exposure to space radiation may place astronauts at significant health risks. This is an un...
This paper addresses the issues involved in radiation testing of devices and subsystems to obtain th...
The PAMELA apparatus is dedicated to study cosmic rays on board of a satellite mission scheduled to ...
To investigate the ELDRS effect in a real space environment, an experiment was designed, launched, a...
We evaluate the low dose rate sensitivity in several families of discrete bipolar transistors across...
The traditional radiation testing of space electronics has been used for more than fifty years to su...
This viewgraph presentation reviews the low temperature, Total Ionizing Dose (TID) tests of radiatio...
Total ionizing dose and displacement damage testing was performed to characterize and determine the ...
This thesis mainly describes a total dose measurement technique using radiation-sensitive field effe...
This paper reports the results of low dose rate (0.01-0.18 rads(Si)/sec) total ionizing dose (TID) t...
Vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displaceme...
Single Board Computers (SBCs) are quickly evolving and gaining capability as their cost comes down. ...
We investigate whether bias conditions arid electrical and thermal stresses can affect the Total Ion...
Thesis: S.M., Massachusetts Institute of Technology, Department of Aeronautics and Astronautics, 201...
In this presentation we will provide basic radiation effects on electronics, information on radiatio...
Purpose: Exposure to space radiation may place astronauts at significant health risks. This is an un...
This paper addresses the issues involved in radiation testing of devices and subsystems to obtain th...
The PAMELA apparatus is dedicated to study cosmic rays on board of a satellite mission scheduled to ...
To investigate the ELDRS effect in a real space environment, an experiment was designed, launched, a...
We evaluate the low dose rate sensitivity in several families of discrete bipolar transistors across...
The traditional radiation testing of space electronics has been used for more than fifty years to su...
This viewgraph presentation reviews the low temperature, Total Ionizing Dose (TID) tests of radiatio...
Total ionizing dose and displacement damage testing was performed to characterize and determine the ...
This thesis mainly describes a total dose measurement technique using radiation-sensitive field effe...
This paper reports the results of low dose rate (0.01-0.18 rads(Si)/sec) total ionizing dose (TID) t...
Vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displaceme...
Single Board Computers (SBCs) are quickly evolving and gaining capability as their cost comes down. ...
We investigate whether bias conditions arid electrical and thermal stresses can affect the Total Ion...
Thesis: S.M., Massachusetts Institute of Technology, Department of Aeronautics and Astronautics, 201...
In this presentation we will provide basic radiation effects on electronics, information on radiatio...
Purpose: Exposure to space radiation may place astronauts at significant health risks. This is an un...
This paper addresses the issues involved in radiation testing of devices and subsystems to obtain th...
The PAMELA apparatus is dedicated to study cosmic rays on board of a satellite mission scheduled to ...