Karakterisasi Perilaku Radar Absorbansi Material (RAM) Berbasis BAM & PANI Dengan Struktur Geometri Multilayer Untuk Rentang Penyerapan X-Band

Karakterisasi perilaku pada material penyerap radar yang terdiri dari Polianilin (PaNi) dan Barium M-Heksaferrit (BaM) telah berhasil disintesis dengan metode solid state. Material konduktif polianilin disintesis menggunakan metode polimerisasi dengan dopan DBSA. Material RAM dikarakterisasi melalui XRay Flourescence (XRF), X-Ray Diffraction (XRD), Fourier Transform Infrared (FTIR), Four Point Probe (FPP), Scanning Electron Microscope (SEM) dan Vector Network Analyzer (VNA). Pendopingan ion Zn2+terhadap struktur BaM telah dilakukan, dimana ion Zn2+ menggantikan ion Fe2+ pada barium Hexaferrit sehingga fasa menjadi softmagnet. Campuran antara material RAM dan cat termasuk dalam komposit dimana material RAM sebagai filler dan cat sebagai binder/matrik. RAM tersebut akan dilapiskan pada plat baja grade A tipe AH36 dengan metode pelapisan Dallenbach multilayer dengan variasi ketebalan yaitu 2.4mm , 3.6mm , 4.8 mm dan 6 mm. Penyerapan gelombang mikro diidentifikasi dengan pengujian VNA dan didapatkan bahwa nilai rugi refleksi maksimum terdapat pada ketebalan 6mm dengan nilai rugi refleksi -32.6 dB pada frekuensi 8.4 GHz. Nilai rugi refleksi variasi multilayer 2.4 mm, 3.6mm dan 4.8mm berturut-turut yaitu -8.02 dB, -19.13 dB dan -28.9 dB pada rentang frekuensi x band. Kata kunci : BaM, Multilayer, Polianilin, RAM, Reflection Loss ========================================================================================================= Characterization of behavior on radar absorbent material consisting of Polianiline (PaNi) and Barium MHexaferrit (BaM) has been successfully synthesized by solid state method. Polyaniline conductive materials are synthesized using polymerization methods with DBSA dopants. RAM materials are characterized by X-Ray Flourescence (XRF), X-Ray Diffraction (XRD), Fourier Transform Infrared (FTIR), Four Point Probe (FPP), Scanning Electron Microscope (SEM) and Vector Network Analyzer (VNA). Zn2+ ionization of the BaM structure has been performed, in which the Zn2 + ion displaces the Fe2 + ion in the Hexaferrit barium so that the phase becomes softmagnet. A mixture of RAM and paint materials is included in the composite where the RAM material as filler and paint as a binder / matrix. RAM will be superimposed on AH36 grade A type steel plate with multilayer Dallenbach coating method with thickness variation of 2.4mm, 3.6mm, 4.8mm and 6mm. Microwave absorption was identified by VNA testing and it was found that the maximum reflection loss value was at 6mm thick with a reflection value of -32.6 dB at 8.4 GHz frequency. The reflection loss values of multilayer variations are 2.4 mm, 3.6mm and 4.8mm respectively -8.02 dB, -19.13 dB and -28.9 dB in the x band frequency range. Keywords : BaM, Multilayer, Polianilin, RAM, Reflection Los