Using atomic force microscopy (AFM) for studying soft, biological material has become increasingly popular in recent years. New approaches allow the use of recursive least squares estimation to identify the viscoelastic properties of a sample in AFM. As long as the regressor vector is persistently exciting (PE), exponential convergence of the parameters to be identified can be guaranteed. However, even exponential convergence can be slow. In this article, upper bounds on the parameter convergence is found, completely determined by the PE properties and least squares update law parameters. Furthermore, for a parameter vector which is piecewise constant at regular intervals, the time interval necessary for the error to converge to any specifi...
The Atomic Force Microscope (AFM), apart form its conventional use as a microscope, is also used for...
Viscoelastic characterization of materials at the micro- and the nanoscale is commonly performed wit...
The analysis of atomic force microscopy (AFM) force data requires the selection of a contact point (...
Identification of mechanical properties of cells has previously been shown to have a great potential...
Electronic supplementary information (ESI) available. See DOI: 10.1039/c9nr04396aQuantitative mappin...
The ability of the atomic force microscope (AFM) to resolve highly accurate interaction forces has m...
Atomic force microscopy (AFM) has become a key enabling technology for high-precision study of mater...
Through several decades, mathematical models have been used to describe real systems. Studying these...
The mechanical characterization of biological samples is a fundamental issue in biology and related ...
Quantifying the nanomechanical properties of soft-matter using multi-frequency atomic force microsco...
We developed force clamp force mapping (FCFM), an atomic force microscopy (AFM) technique for measur...
Contact resonance atomic force microscope (CR-AFM) methods are relatively new measurement techniques...
The dynamics of an oscillating Atomic Force Microscopy (AFM) tip tapping on a polymer surface are ke...
Dynamic mechanical behaviour of living cells has been described by viscoelasticity. However, quantit...
Organisms are composed by cells, and the cells can also reflect the physiology of creatures. The com...
The Atomic Force Microscope (AFM), apart form its conventional use as a microscope, is also used for...
Viscoelastic characterization of materials at the micro- and the nanoscale is commonly performed wit...
The analysis of atomic force microscopy (AFM) force data requires the selection of a contact point (...
Identification of mechanical properties of cells has previously been shown to have a great potential...
Electronic supplementary information (ESI) available. See DOI: 10.1039/c9nr04396aQuantitative mappin...
The ability of the atomic force microscope (AFM) to resolve highly accurate interaction forces has m...
Atomic force microscopy (AFM) has become a key enabling technology for high-precision study of mater...
Through several decades, mathematical models have been used to describe real systems. Studying these...
The mechanical characterization of biological samples is a fundamental issue in biology and related ...
Quantifying the nanomechanical properties of soft-matter using multi-frequency atomic force microsco...
We developed force clamp force mapping (FCFM), an atomic force microscopy (AFM) technique for measur...
Contact resonance atomic force microscope (CR-AFM) methods are relatively new measurement techniques...
The dynamics of an oscillating Atomic Force Microscopy (AFM) tip tapping on a polymer surface are ke...
Dynamic mechanical behaviour of living cells has been described by viscoelasticity. However, quantit...
Organisms are composed by cells, and the cells can also reflect the physiology of creatures. The com...
The Atomic Force Microscope (AFM), apart form its conventional use as a microscope, is also used for...
Viscoelastic characterization of materials at the micro- and the nanoscale is commonly performed wit...
The analysis of atomic force microscopy (AFM) force data requires the selection of a contact point (...