The differential scattering cross section for diffuse scattering of X-rays from thinfilm structures is discussed within the framework of the distorted wave Born ap-proximation (DWBA). In contrast to the standard Born approximation (BA), thedistorted wave approach succeeds in calculating scattering from surfaces near thecritical angle of reflection. The method is particularly useful for studying averagesurface properties.Compromises made in the derivation of the model substantially simplify thefinal expression, but also limit its range of validity, which depends on the surfaceroot mean square roughness σ and the momentum transfer between the incidentand scattered X-rays perpendicular to the surface, Qz . The approximation is validso long as ...
We have developed a new Small Angle X-ray Scattering (SAXS) technique by use of reflection geometry ...
We present a mathematical model that relates the surface morphology of randomly surface-textured thi...
Recent calculations predict a dramatic influence of interfaces on the scattering of x rays by single...
The structure of thin films and interfaces can be probed by X-ray specular and off-specular (diffuse...
A self-consistent analytical approach for specular x-ray reflection from interfaces with transition ...
X-ray reflectivity is now a common tool for investigating density profiles of thin films and multila...
Grazing incidence diffuse X-ray scattering data from a Co-Cu multilayer with stepped interfaces grow...
In this paper it is shown that diffuse-scattering experiments within the region of total external re...
The study of surface and interface structure of thin film devices is becoming increasingly important...
This thesis studies the diffuse x-ray scattering from rough interfaces. We review the scaling hypoth...
Available from British Library Document Supply Centre- DSC:8715.1804(CLRC-RAL-TR--95-020) / BLDSC - ...
Grazing-incidence small-angle X-ray scattering (GISAXS) is an important technique in the characteriz...
We have presented new schemes to analyse grazing incidence specular X-ray reflectivity data to obtai...
The theory of X-ray scattering from rough interfaces using the second-order distorted-wave Born appr...
Diffuse x-ray reflection from a SiGe/Si multilayer grown pseudomorphically on slightly miscut Si(OO ...
We have developed a new Small Angle X-ray Scattering (SAXS) technique by use of reflection geometry ...
We present a mathematical model that relates the surface morphology of randomly surface-textured thi...
Recent calculations predict a dramatic influence of interfaces on the scattering of x rays by single...
The structure of thin films and interfaces can be probed by X-ray specular and off-specular (diffuse...
A self-consistent analytical approach for specular x-ray reflection from interfaces with transition ...
X-ray reflectivity is now a common tool for investigating density profiles of thin films and multila...
Grazing incidence diffuse X-ray scattering data from a Co-Cu multilayer with stepped interfaces grow...
In this paper it is shown that diffuse-scattering experiments within the region of total external re...
The study of surface and interface structure of thin film devices is becoming increasingly important...
This thesis studies the diffuse x-ray scattering from rough interfaces. We review the scaling hypoth...
Available from British Library Document Supply Centre- DSC:8715.1804(CLRC-RAL-TR--95-020) / BLDSC - ...
Grazing-incidence small-angle X-ray scattering (GISAXS) is an important technique in the characteriz...
We have presented new schemes to analyse grazing incidence specular X-ray reflectivity data to obtai...
The theory of X-ray scattering from rough interfaces using the second-order distorted-wave Born appr...
Diffuse x-ray reflection from a SiGe/Si multilayer grown pseudomorphically on slightly miscut Si(OO ...
We have developed a new Small Angle X-ray Scattering (SAXS) technique by use of reflection geometry ...
We present a mathematical model that relates the surface morphology of randomly surface-textured thi...
Recent calculations predict a dramatic influence of interfaces on the scattering of x rays by single...