In this paper, the reliability prediction of a power electronics building block (PEBB) printed circuit board assembly (PCBA) is performed using the Part Stress Method from the MIL-HDBK-217FN2 handbook. The breakdown of the predicted reliability with respect to circuit functional blocks is presented. Furthermore, different cases are shown, where the components with small or large failure rate dominate. Finally, the ANSI-VITA51.1 adjustments are applied and their influence on the reliability prediction results and their usage are discussed
This paper describes a framework that is being developed for the prediction and analysis of electron...
An independent study has been carried out to assess the extent to which the physics-of-failure (PoF)...
Interconnect Stress Testing (IST) was developed during the 1990’s as a test method for measuring pla...
Reliability quantification is one of the most important tasks in Reliability Engineering. During the...
Reliability test is a very important step for any electronic products before they can be sold to the...
This paper discusses the reliability of power electronics modules. The approach taken combines numer...
Reliability prediction of the electronic components used in industrial safety systems requires high ...
In recent decades, the electronic industry has shown a clear trend towards miniaturization with incr...
This paper describes a physics-of-failure (PoF) based prognostic method for power electronics module...
Reliability prediction assists manufacturers to eliminate product failures in the development stage ...
This paper presents a method to predict the reliability of electronic components subjected to intens...
This paper discusses the reliability of an IGBT power electronics module. This work is part of a maj...
Traditional approaches like MIL-HDBK, Telcordia, and PRISM etc. have limitation in accurately predic...
Nowadays, the trend of microelectronic devices is to achieve more functions but with smaller sizes. ...
One of the most controversial procedures in reliability is the use of reliability prediction techniq...
This paper describes a framework that is being developed for the prediction and analysis of electron...
An independent study has been carried out to assess the extent to which the physics-of-failure (PoF)...
Interconnect Stress Testing (IST) was developed during the 1990’s as a test method for measuring pla...
Reliability quantification is one of the most important tasks in Reliability Engineering. During the...
Reliability test is a very important step for any electronic products before they can be sold to the...
This paper discusses the reliability of power electronics modules. The approach taken combines numer...
Reliability prediction of the electronic components used in industrial safety systems requires high ...
In recent decades, the electronic industry has shown a clear trend towards miniaturization with incr...
This paper describes a physics-of-failure (PoF) based prognostic method for power electronics module...
Reliability prediction assists manufacturers to eliminate product failures in the development stage ...
This paper presents a method to predict the reliability of electronic components subjected to intens...
This paper discusses the reliability of an IGBT power electronics module. This work is part of a maj...
Traditional approaches like MIL-HDBK, Telcordia, and PRISM etc. have limitation in accurately predic...
Nowadays, the trend of microelectronic devices is to achieve more functions but with smaller sizes. ...
One of the most controversial procedures in reliability is the use of reliability prediction techniq...
This paper describes a framework that is being developed for the prediction and analysis of electron...
An independent study has been carried out to assess the extent to which the physics-of-failure (PoF)...
Interconnect Stress Testing (IST) was developed during the 1990’s as a test method for measuring pla...