Ellipsometry is rapidly emerging as a popular solution addressed to new materials science challenges and technological pitfalls hindering its effective application on modern problems. Amid the nowadays active development of materials of top notch, ellipsometry is also evolving rapidly both in the academic and industry sectors. The global industry strategies, introduce the latest scientific advances at manufacturing new, more accurate, and reliable ellipsometry systems to tackle emerging challenges. The book provides a comprehensive overview on the principles and technical capabilities of the modern ellipsometry highlighting its versatility in materials characterization
Ellipsometry is a proven method for measuring layer thicknesses of flat, specularly reflective surfa...
[[abstract]]Coating technology has played an important role in optics, opto-electronics, semiconduct...
The manufacture of optical coatings, computer disks, as well as advanced electronic multilayered dev...
This paper describes the use of ellipsometry as a precise and accurate technique for characterizing ...
This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge bet...
Measurements of optical properties provide insight into how materials interact with electromagnetic ...
The index of refraction is a material property that determines the speed of light propagating throug...
Ellipsometry is an optical method used for characterizing materials and thin films. The principle is...
Les caractéristiques suivantes rendent l'éllipsométrie utile pour résoudre de nombreux problèmes con...
This new edition provides a state-of-the-art survey of ellipsometric methods used to study organic f...
International audienceSpectroscopic ellipsometry is a very sensitive optical metrology technique com...
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer...
The possibilities of ellipsometric method for optimization of identification of refractive index of ...
Since the work of Geim of graphene as the first 2D material, application and rese- arch of 2D mater...
International audienceSpectroscopic ellipsometry (SE) is known to be a technique of great sensitivit...
Ellipsometry is a proven method for measuring layer thicknesses of flat, specularly reflective surfa...
[[abstract]]Coating technology has played an important role in optics, opto-electronics, semiconduct...
The manufacture of optical coatings, computer disks, as well as advanced electronic multilayered dev...
This paper describes the use of ellipsometry as a precise and accurate technique for characterizing ...
This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge bet...
Measurements of optical properties provide insight into how materials interact with electromagnetic ...
The index of refraction is a material property that determines the speed of light propagating throug...
Ellipsometry is an optical method used for characterizing materials and thin films. The principle is...
Les caractéristiques suivantes rendent l'éllipsométrie utile pour résoudre de nombreux problèmes con...
This new edition provides a state-of-the-art survey of ellipsometric methods used to study organic f...
International audienceSpectroscopic ellipsometry is a very sensitive optical metrology technique com...
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer...
The possibilities of ellipsometric method for optimization of identification of refractive index of ...
Since the work of Geim of graphene as the first 2D material, application and rese- arch of 2D mater...
International audienceSpectroscopic ellipsometry (SE) is known to be a technique of great sensitivit...
Ellipsometry is a proven method for measuring layer thicknesses of flat, specularly reflective surfa...
[[abstract]]Coating technology has played an important role in optics, opto-electronics, semiconduct...
The manufacture of optical coatings, computer disks, as well as advanced electronic multilayered dev...