Cathodoluminescence (CL) is a non-destructive technique to characterize optical and electronic properties of nanostructures in many kinds of materials. Major subject is to investigate basic parameters in semiconductors, impurities in oxides and phase determination of minerals. CL gives information on carrier concentration, diffusion length and life time of minority carriers in semiconductors, and impurity concentration and phase composition in composite materials. This book involves 13 chapters to present the basics in the CL technique and applications to particles, thin films and nanostructures in semiconductors, oxides and minerals. The chapters covered in this book include recent development of CL technique and applications to wide range...
Thin film samples have been increasingly used in high resolution imaging studies of cathodoluminesce...
Low energy cathodoluminescence spectroscopy (CLS) is a powerful new technique for characterizing the...
This papers reports on the microcharacterization of devices for optoelectronic and high-speed electr...
Cathodoluminescence (CL) is a very powerful technique for studying the optical properties of semicon...
Spatially and spectrally resolved cathodoluminescence in the scanning electron microscope is a very ...
We give an overview of the use of cathodoluminescence (CL) in scanning electron microscopy (SEM) for...
Cathodoluminescence (CL) microscopy and spectroscopy are enabling techniques for the microcharacteri...
Herein, we describe three advanced techniques for cathodoluminescence (CL) spectroscopy that have re...
Cathodoluminescence (CL) imaging spectroscopy is a powerful tool to investi-gate the optical propert...
© 2015 Elsevier Ltd. All rights reserved. Cathodoluminescence (CL) is an enabling quantitative techn...
Applicability of cathodouminescence (CL) measurements in development of functional materials for adv...
The increasing demand for new opto-electronics devices such as solar cells, laser diodes (LD), and h...
Quantitative cathodoluminescence (CL) microscopy is a new optical spectroscopy technique that measur...
This book provides an overview of cathodoluminescence properties of the planetary materials. It prov...
Cathodoluminescence (CL) provides a sensitive analytical probe of the near-surface region of insulat...
Thin film samples have been increasingly used in high resolution imaging studies of cathodoluminesce...
Low energy cathodoluminescence spectroscopy (CLS) is a powerful new technique for characterizing the...
This papers reports on the microcharacterization of devices for optoelectronic and high-speed electr...
Cathodoluminescence (CL) is a very powerful technique for studying the optical properties of semicon...
Spatially and spectrally resolved cathodoluminescence in the scanning electron microscope is a very ...
We give an overview of the use of cathodoluminescence (CL) in scanning electron microscopy (SEM) for...
Cathodoluminescence (CL) microscopy and spectroscopy are enabling techniques for the microcharacteri...
Herein, we describe three advanced techniques for cathodoluminescence (CL) spectroscopy that have re...
Cathodoluminescence (CL) imaging spectroscopy is a powerful tool to investi-gate the optical propert...
© 2015 Elsevier Ltd. All rights reserved. Cathodoluminescence (CL) is an enabling quantitative techn...
Applicability of cathodouminescence (CL) measurements in development of functional materials for adv...
The increasing demand for new opto-electronics devices such as solar cells, laser diodes (LD), and h...
Quantitative cathodoluminescence (CL) microscopy is a new optical spectroscopy technique that measur...
This book provides an overview of cathodoluminescence properties of the planetary materials. It prov...
Cathodoluminescence (CL) provides a sensitive analytical probe of the near-surface region of insulat...
Thin film samples have been increasingly used in high resolution imaging studies of cathodoluminesce...
Low energy cathodoluminescence spectroscopy (CLS) is a powerful new technique for characterizing the...
This papers reports on the microcharacterization of devices for optoelectronic and high-speed electr...