Growth, Characterization, and Photovoltaic Application of Copper Oxide Thin Films

These are experimental data for the characterization of cuprous and cupric oxide, grown as thin films by electrodeposition. There are results for XRD, XPS (valence band measurement), SEM, EDS, Raman Spectroscopy, Optical Spectroscopy, Electrochemical Voltammetry and related techniques. Also, there are some theoretical results, calculated from DFT