The InP HEMT is the preferred transistor technology for cryogenic low-noise amplification from 1 GHz up to 200 GHz. The InP HEMT shows its superiority at temperatures 5 to 15 K and technology development must be made with knowledge about the special circumstances occurring in III- V materials and device operating under cryogenic conditions. We report on how to electrically stabilize the cryogenic two-finger HEMT at low temperature making it possible to design low-noise amplifiers with state of the art noise performance up to mm-wave. We also demonstrate recent progress on optimizing the InP HEMT for cryogenic low-noise amplifier operation below 1 mW dc power dissipation, of interest for qubit readout electronics
Detailed S-parameter and noise characterization and modeling of ultralow-noise InP/InAlAs/InGaAs hig...
The scaling effect of the source-drain distance was investigated in order to improve the performance...
The scaling effect of the source-drain distance was investigated in order to improve the performance...
This paper reports on a 100-nm gate length InP high-electron-mobility transistor (HEMT) technology f...
We present in this letter an InGaAs/InAlAs/InP high-electron-mobility transistor (InP HEMT) with rec...
Indium phosphide high electron mobility transistors (InP HEMTs), are today the best transistors for ...
InGaAs/InAlAs/InP High Electron Mobility Transistors (InP HEMTs), are today the best devices to desi...
Indium phosphide high electron mobility transistors (InP HEMTs), are today the best transistors for ...
Experimental results and Monte Carlosimulations have been analyzed and compared at 300 K and 77 K fo...
Experimental results and Monte Carlosimulations have been analyzed and compared at 300 K and 77 K fo...
We investigate the cryogenic stability of two-finger 100-nm gate-length InP HEMTs aimed for Ka- and ...
We investigate the cryogenic stability of two-finger 100-nm gate-length InP HEMTs aimed for Ka- and ...
This paper reports on ultra-low power 4-8 GHz (C-band) InP high-electron mobility transistor (HEMT) ...
Experimental results and Monte Carlo simulations have been analyzed and compared at 300 K and 77 K f...
Detailed S-parameter and noise characterization and modeling of ultralow-noise InP/InAlAs/InGaAs hig...
Detailed S-parameter and noise characterization and modeling of ultralow-noise InP/InAlAs/InGaAs hig...
The scaling effect of the source-drain distance was investigated in order to improve the performance...
The scaling effect of the source-drain distance was investigated in order to improve the performance...
This paper reports on a 100-nm gate length InP high-electron-mobility transistor (HEMT) technology f...
We present in this letter an InGaAs/InAlAs/InP high-electron-mobility transistor (InP HEMT) with rec...
Indium phosphide high electron mobility transistors (InP HEMTs), are today the best transistors for ...
InGaAs/InAlAs/InP High Electron Mobility Transistors (InP HEMTs), are today the best devices to desi...
Indium phosphide high electron mobility transistors (InP HEMTs), are today the best transistors for ...
Experimental results and Monte Carlosimulations have been analyzed and compared at 300 K and 77 K fo...
Experimental results and Monte Carlosimulations have been analyzed and compared at 300 K and 77 K fo...
We investigate the cryogenic stability of two-finger 100-nm gate-length InP HEMTs aimed for Ka- and ...
We investigate the cryogenic stability of two-finger 100-nm gate-length InP HEMTs aimed for Ka- and ...
This paper reports on ultra-low power 4-8 GHz (C-band) InP high-electron mobility transistor (HEMT) ...
Experimental results and Monte Carlo simulations have been analyzed and compared at 300 K and 77 K f...
Detailed S-parameter and noise characterization and modeling of ultralow-noise InP/InAlAs/InGaAs hig...
Detailed S-parameter and noise characterization and modeling of ultralow-noise InP/InAlAs/InGaAs hig...
The scaling effect of the source-drain distance was investigated in order to improve the performance...
The scaling effect of the source-drain distance was investigated in order to improve the performance...