Millimeter wave technologies have widespread applications, for which dielectric permittivity is a fundamental parameter. The non-resonant free-space measurement techniques for dielectric permittivity using vector network analysis in the millimeter wave range are reviewed. An introductory look at the applications, significance, and properties of dielectric permittivity in the millimeter wave range is addressed first. The principal aspects of free-space millimeter wave measurement methods are then discussed, by assessing a variety of systems, theoretical models, extraction algorithms and calibration methods. In addition to conventional solid dielectric materials, the measurement of artificial metamaterials, liquid, and gaseous-phased samples ...
This paper presents a fast, accurate and easy to use measurement method to extract two parameters of...
In this contribution, we present a measurement system for material characterization in the millimete...
This master thesis investigates material characterization by reflection and transmission of electrom...
From Elsevier via Jisc Publications RouterHistory: accepted 2021-04-20, issue date 2021-05-07Article...
From Elsevier via Jisc Publications RouterHistory: accepted 2021-04-20, epub 2021-05-12, issue date ...
Modified free space method using a vector network analyzer is proposed. The algorithm for determinin...
Abstract—In this paper, a new free-space measurement setup at millimeter waves for material characte...
International audienceThis presentation deals with our experience on free space calibration techniqu...
International audienceThis presentation deals with our experience on free space calibration techniqu...
Frequently, when free-space electromagnetic waves pass through a material, there will be some form o...
International audienceThis presentation deals with our experience on free space calibration techniqu...
Microwave characterization is an important tool to characterize different materials precisely and of...
International audienceThis presentation deals with our experience on free space calibration techniqu...
Frequently, when free-space electromagnetic waves pass through a material, there will be some form o...
This paper presents a fast, accurate and easy to use measurement method to extract two parameters of...
This paper presents a fast, accurate and easy to use measurement method to extract two parameters of...
In this contribution, we present a measurement system for material characterization in the millimete...
This master thesis investigates material characterization by reflection and transmission of electrom...
From Elsevier via Jisc Publications RouterHistory: accepted 2021-04-20, issue date 2021-05-07Article...
From Elsevier via Jisc Publications RouterHistory: accepted 2021-04-20, epub 2021-05-12, issue date ...
Modified free space method using a vector network analyzer is proposed. The algorithm for determinin...
Abstract—In this paper, a new free-space measurement setup at millimeter waves for material characte...
International audienceThis presentation deals with our experience on free space calibration techniqu...
International audienceThis presentation deals with our experience on free space calibration techniqu...
Frequently, when free-space electromagnetic waves pass through a material, there will be some form o...
International audienceThis presentation deals with our experience on free space calibration techniqu...
Microwave characterization is an important tool to characterize different materials precisely and of...
International audienceThis presentation deals with our experience on free space calibration techniqu...
Frequently, when free-space electromagnetic waves pass through a material, there will be some form o...
This paper presents a fast, accurate and easy to use measurement method to extract two parameters of...
This paper presents a fast, accurate and easy to use measurement method to extract two parameters of...
In this contribution, we present a measurement system for material characterization in the millimete...
This master thesis investigates material characterization by reflection and transmission of electrom...