Add to ORKGTest algorithms and determining factors in choosing a repair architecture -- Global architecture and the self-testing function -- The self-repairing function and the SRAM block
This thesis introduces a comprehensive approach for making a particular class of embedded processors...
[[abstract]]Embedded memories are among the most widely used cores in current system-on-chip (SOC) i...
Built-in self -test (BIST) refers to those testing techniques where additional hardware is added to ...
A built-in self repair analyzer with the optimal repair rate for memory arrays with redundancy. The ...
The technology shrinkage and the increased demand for high storage memory devices in today’s system ...
Abstract- This paper proposes Built-In Self-Repair Analyzer (BISR) strategy with Redundancy which is...
[[abstract]]In this paper we propose a novel built-in self-test (BIST) design for embedded SRAM core...
NUMBER OF PAGES: (xliv+1199+x+305 suppl.)In modern SoCs, embedded memories occupy the largest part o...
[[abstract]]We propose an embedded processor-based built-in self-repair (BISR) design for embedded m...
[[abstract]]Embedded memory test and diagnosis is becoming an important issue in system-on-chip (SOC...
Abstract—In this paper, a built-in self repair technique for word-oriented two-port SRAM memories is...
Nanometer memories are highly prone to defects due to dense structure, necessitating memory built-in...
Embedded random access memories (RAMs) are increasingly being tested using built-in self-test (BIST)...
The new generations of SRAM-based FPGA devices, built on nanometer technology, are the preferred cho...
The current system-on-chip (SoC)-based devices uses embedded memories of enormous size. Most of thes...
This thesis introduces a comprehensive approach for making a particular class of embedded processors...
[[abstract]]Embedded memories are among the most widely used cores in current system-on-chip (SOC) i...
Built-in self -test (BIST) refers to those testing techniques where additional hardware is added to ...
A built-in self repair analyzer with the optimal repair rate for memory arrays with redundancy. The ...
The technology shrinkage and the increased demand for high storage memory devices in today’s system ...
Abstract- This paper proposes Built-In Self-Repair Analyzer (BISR) strategy with Redundancy which is...
[[abstract]]In this paper we propose a novel built-in self-test (BIST) design for embedded SRAM core...
NUMBER OF PAGES: (xliv+1199+x+305 suppl.)In modern SoCs, embedded memories occupy the largest part o...
[[abstract]]We propose an embedded processor-based built-in self-repair (BISR) design for embedded m...
[[abstract]]Embedded memory test and diagnosis is becoming an important issue in system-on-chip (SOC...
Abstract—In this paper, a built-in self repair technique for word-oriented two-port SRAM memories is...
Nanometer memories are highly prone to defects due to dense structure, necessitating memory built-in...
Embedded random access memories (RAMs) are increasingly being tested using built-in self-test (BIST)...
The new generations of SRAM-based FPGA devices, built on nanometer technology, are the preferred cho...
The current system-on-chip (SoC)-based devices uses embedded memories of enormous size. Most of thes...
This thesis introduces a comprehensive approach for making a particular class of embedded processors...
[[abstract]]Embedded memories are among the most widely used cores in current system-on-chip (SOC) i...
Built-in self -test (BIST) refers to those testing techniques where additional hardware is added to ...