The development of acoustic subsurface atomic force microscopy, which promises three-dimensional imaging with single-digit nanometer resolution by the introduction of ultrasound actuations to a conventional atomic force microscope, has come a long way since its inception in the early 1990s. Recent advances provide a quantitative understanding of the different experimentally observed contrast mechanisms, which paves the way for future applications. In this Perspective, we first review the different subsurface atomic force microscope modalities: ultrasonic force microscopy, atomic force acoustic microscopy, heterodyne force microscopy, mode-synthesizing atomic force microscopy, and near-field picosecond ultrasonic microscopy. Then, we highlig...
During the last decade, Atomic Force Microscopy (AFM) has been widely used to image the topography o...
Advanced Scanning Probe Microscopy techniques combine Atomic Force Microscopy (AFM) with ultrasound....
Use of high frequency (HF) vibrations at MHz frequencies in Atomic Force Microscopy (AFM) advanced n...
We present a new type of near-field Acoustic Microscopy combining Atomic Force Microscopy (AFM) and ...
Imaging subsurface structures with nanometer resolution has been a long-standing desire in science a...
According to Abbe's limit, the lateral resolution of microscopes is restricted to approximately one ...
Analysis shows that acoustic imaging based on the detection of ultrasonic fields using a modified at...
We present a novel method for nanometer resolution subsurface imaging. When a sample of atomic force...
Imaging of nanoscale structures buried in a covering material is an extremely challenging task, but ...
Over the past few years, sub-surface imaging techniques at the nano-scale have become increasingly i...
Different acoustical near-field microscopes have been developed, some of which combine the high late...
Recent advances in mechanical diode-based ultrasonic force microscopy techniques are reviewed. The p...
Nondestructive subsurface nanoimaging of buried nanostructures is considered to be extremely challen...
The combination of ultrasound with atomic force microscopy (AFM) opens the high lateral resolution o...
We have constructed an atomic force microscope enabling one to image the topography of a sample, and...
During the last decade, Atomic Force Microscopy (AFM) has been widely used to image the topography o...
Advanced Scanning Probe Microscopy techniques combine Atomic Force Microscopy (AFM) with ultrasound....
Use of high frequency (HF) vibrations at MHz frequencies in Atomic Force Microscopy (AFM) advanced n...
We present a new type of near-field Acoustic Microscopy combining Atomic Force Microscopy (AFM) and ...
Imaging subsurface structures with nanometer resolution has been a long-standing desire in science a...
According to Abbe's limit, the lateral resolution of microscopes is restricted to approximately one ...
Analysis shows that acoustic imaging based on the detection of ultrasonic fields using a modified at...
We present a novel method for nanometer resolution subsurface imaging. When a sample of atomic force...
Imaging of nanoscale structures buried in a covering material is an extremely challenging task, but ...
Over the past few years, sub-surface imaging techniques at the nano-scale have become increasingly i...
Different acoustical near-field microscopes have been developed, some of which combine the high late...
Recent advances in mechanical diode-based ultrasonic force microscopy techniques are reviewed. The p...
Nondestructive subsurface nanoimaging of buried nanostructures is considered to be extremely challen...
The combination of ultrasound with atomic force microscopy (AFM) opens the high lateral resolution o...
We have constructed an atomic force microscope enabling one to image the topography of a sample, and...
During the last decade, Atomic Force Microscopy (AFM) has been widely used to image the topography o...
Advanced Scanning Probe Microscopy techniques combine Atomic Force Microscopy (AFM) with ultrasound....
Use of high frequency (HF) vibrations at MHz frequencies in Atomic Force Microscopy (AFM) advanced n...