Ultra-deep submicron circuits require accurate modeling of gate delay in order to meetaggressive timing constraints. With the lack of statistical data, variability due to the mechanical manufacturing process and its chemical properties poses a challenging problem. Discrete gate sizing requires (i) accurate models that take into account random parametric variation and (ii) a fair allocation of resources to optimize the solution. The proposed GTFUZZ gate sizing algorithm handles both tasks. Gate sizing is modeled as a resource allocation problem using fuzzy game theory. Delay is modeled as a constraint and power is optimized in this algorithm. In GTFUZZ, delay is modeled as a fuzzy goal with fuzzy parameters to capture the imprecision of gate...
The continuous scaling of interconnect wires in deep submicron (DSM)circuits result in increased int...
Abstract — Process variations cause design performance to become unpredictable in deep sub-micron te...
The continuous scaling of interconnect wires in deep submicron (DSM)circuits result in increased int...
Ultra-deep submicron circuits require accurate modeling of gate delay in order to meetaggressive tim...
Ultra-deep submicron circuits require accurate modeling of gate delay in order to meetaggressive tim...
Technology scaling has increased the transistor\u27s susceptibility to process variations in nanomet...
Technology scaling has increased the transistor\u27s susceptibility to process variations in nanomet...
Technology scaling has increased the transistor\u27s susceptibility to process variations in nanomet...
Abstract In this paper, we approach the gate sizing problem in VLSI circuits in the context of incr...
Gate sizing is one of the most flexible and powerful methods available for the timing and power opti...
Sizing has shown its impact on design automation of VLSI circuits. At first, the cost of the circuit...
Abstract—Gate sizing has a significant impact on the de-lay, power dissipation, and area of the fina...
textIn today's world, it is becoming increasingly important to be able to design high performance in...
This paper presents a novel gate sizing methodology to mini-mize the leakage power in the presence o...
Abstract—As technology scales into the sub-90nm domain, manufacturing variations become an increasin...
The continuous scaling of interconnect wires in deep submicron (DSM)circuits result in increased int...
Abstract — Process variations cause design performance to become unpredictable in deep sub-micron te...
The continuous scaling of interconnect wires in deep submicron (DSM)circuits result in increased int...
Ultra-deep submicron circuits require accurate modeling of gate delay in order to meetaggressive tim...
Ultra-deep submicron circuits require accurate modeling of gate delay in order to meetaggressive tim...
Technology scaling has increased the transistor\u27s susceptibility to process variations in nanomet...
Technology scaling has increased the transistor\u27s susceptibility to process variations in nanomet...
Technology scaling has increased the transistor\u27s susceptibility to process variations in nanomet...
Abstract In this paper, we approach the gate sizing problem in VLSI circuits in the context of incr...
Gate sizing is one of the most flexible and powerful methods available for the timing and power opti...
Sizing has shown its impact on design automation of VLSI circuits. At first, the cost of the circuit...
Abstract—Gate sizing has a significant impact on the de-lay, power dissipation, and area of the fina...
textIn today's world, it is becoming increasingly important to be able to design high performance in...
This paper presents a novel gate sizing methodology to mini-mize the leakage power in the presence o...
Abstract—As technology scales into the sub-90nm domain, manufacturing variations become an increasin...
The continuous scaling of interconnect wires in deep submicron (DSM)circuits result in increased int...
Abstract — Process variations cause design performance to become unpredictable in deep sub-micron te...
The continuous scaling of interconnect wires in deep submicron (DSM)circuits result in increased int...