The effect of plasma Coulomb microfied dynamics on spectral line shapes is under consideration. The analytical solution of the problem is unachievable with famous Chandrasekhar–Von-Neumann results up to the present time. The alternative methods are connected with modeling of a real ion Coulomb field dynamics by approximate models. One of the most accurate theories of ions dynamics effect on line shapes in plasmas is the Frequency Fluctuation Model (FFM) tested by the comparison with plasma microfield numerical simulations. The goal of the present paper is to make a detailed comparison of the FFM results with analytical ones for the linear and quadratic Stark effects in different limiting cases. The main problem is connected with perturbatio...
Producción CientíficaModeling the Stark broadening of spectral lines in plasmas is a complex problem...
International audienceOwing to the increasing sensitivity of detectors, accurate line profiles are n...
Owing to the increasing sensitivity of detectors, accurate line profiles are needed for accurate ste...
The study deals with two conceptual problems in the theory of Stark broadening by plasmas. One probl...
Abstract: The effect of spectral line broadening under influence of ion microfield (Stark ...
International audienceA very fast method to account for charged particle dynamics effects in calcula...
International audienceA new expression for the Stark profiles of spectral lines in plasma has been o...
International audienceA method for calculating the redistribution of resonance radiation in hot, den...
We present a Stark-Zeeman spectral line shape model and the associated numerical code, PPPB, designe...
Stark broadening theory is currently operated for calculating widths and shifts of spectral lines th...
International audienceA model is developed that permits the calculation of the radiation emitted by ...
International audienceImpact approximation is widely used for calculating Stark broadening in a plas...
A review of studies of the electric-field influence on spectral lines is presented, beginning from t...
International audienceThe standard static-ion impact electron theory of line broadening is assessed ...
Modeling the Stark broadening of spectral lines in plasmas is a complex problem. The problem has a l...
Producción CientíficaModeling the Stark broadening of spectral lines in plasmas is a complex problem...
International audienceOwing to the increasing sensitivity of detectors, accurate line profiles are n...
Owing to the increasing sensitivity of detectors, accurate line profiles are needed for accurate ste...
The study deals with two conceptual problems in the theory of Stark broadening by plasmas. One probl...
Abstract: The effect of spectral line broadening under influence of ion microfield (Stark ...
International audienceA very fast method to account for charged particle dynamics effects in calcula...
International audienceA new expression for the Stark profiles of spectral lines in plasma has been o...
International audienceA method for calculating the redistribution of resonance radiation in hot, den...
We present a Stark-Zeeman spectral line shape model and the associated numerical code, PPPB, designe...
Stark broadening theory is currently operated for calculating widths and shifts of spectral lines th...
International audienceA model is developed that permits the calculation of the radiation emitted by ...
International audienceImpact approximation is widely used for calculating Stark broadening in a plas...
A review of studies of the electric-field influence on spectral lines is presented, beginning from t...
International audienceThe standard static-ion impact electron theory of line broadening is assessed ...
Modeling the Stark broadening of spectral lines in plasmas is a complex problem. The problem has a l...
Producción CientíficaModeling the Stark broadening of spectral lines in plasmas is a complex problem...
International audienceOwing to the increasing sensitivity of detectors, accurate line profiles are n...
Owing to the increasing sensitivity of detectors, accurate line profiles are needed for accurate ste...