A micro-device vibration measurement method based on microscopic speckle interferometry combined with orthogonal phase is presented. This method utilizes the approximate linear distribution characteristics of orthogonal points (points satisfying the condition that the initial phase difference equal to π/2) to quickly obtain the vibration information of the measured object. Compared with common optical measurement methods, this method does not require scanning imaging and can realize real-time full-field measurement. Moreover, the measurement principle and equipment is simple, so there is no need to introduce a stroboscopic light source or heterodyne device
Design, manufacturing and test of microcomponents generate new challenges for measurement techniques...
An out-of-plane sensitive electronic speckle pattern interferometer (ESPI) using holographic optical...
Poster presented at Frontiers in Optics (FiO) Rochester, New York, October 19, 2008A compact optica...
As there exist some problems with the previous laser diode (LD) real-time microvibration measurement...
A stroboscopically illuminated ESPI system is described for the simultaneous measurement of vibratio...
10.1117/12.514242Proceedings of SPIE - The International Society for Optical Engineering5116 II912-9...
The traditional microscopic speckle interferometer has limited applications in engineering due to it...
The growing number of component parts with very small functional features leads to a demand for meas...
We present a technique for the measurement of both amplitude and phase of sinusoidal vibrations that...
Measuring deformation of vibrating specimens whose dimensions are in the submillimeter range introdu...
A digital speckle-pattern interferometer was built utilizing a 100 x 100 element Reticon diode array...
Based on the semiconductor laser whose spectral line with width is compressed to be less than 1.2Mhz...
AbstractIn this article, method for determining in real time the frequency characteristics (amplitud...
Single wavelength microscopic speckle interferometry is widely used for deformation, shape and non-d...
We present a new microscopy tool for quantitative measurement of the resonant motion of microstructu...
Design, manufacturing and test of microcomponents generate new challenges for measurement techniques...
An out-of-plane sensitive electronic speckle pattern interferometer (ESPI) using holographic optical...
Poster presented at Frontiers in Optics (FiO) Rochester, New York, October 19, 2008A compact optica...
As there exist some problems with the previous laser diode (LD) real-time microvibration measurement...
A stroboscopically illuminated ESPI system is described for the simultaneous measurement of vibratio...
10.1117/12.514242Proceedings of SPIE - The International Society for Optical Engineering5116 II912-9...
The traditional microscopic speckle interferometer has limited applications in engineering due to it...
The growing number of component parts with very small functional features leads to a demand for meas...
We present a technique for the measurement of both amplitude and phase of sinusoidal vibrations that...
Measuring deformation of vibrating specimens whose dimensions are in the submillimeter range introdu...
A digital speckle-pattern interferometer was built utilizing a 100 x 100 element Reticon diode array...
Based on the semiconductor laser whose spectral line with width is compressed to be less than 1.2Mhz...
AbstractIn this article, method for determining in real time the frequency characteristics (amplitud...
Single wavelength microscopic speckle interferometry is widely used for deformation, shape and non-d...
We present a new microscopy tool for quantitative measurement of the resonant motion of microstructu...
Design, manufacturing and test of microcomponents generate new challenges for measurement techniques...
An out-of-plane sensitive electronic speckle pattern interferometer (ESPI) using holographic optical...
Poster presented at Frontiers in Optics (FiO) Rochester, New York, October 19, 2008A compact optica...