Sequential fault diagnosis is a kind of important fault diagnosis method for large scale complex systems, and generating an excellent fault diagnosis strategy is critical to ensuring the performance of sequential diagnosis. However, with the system complexity increasing, the complexity of fault diagnosis tree increases sharply, which makes it extremely difficult to generate an optimal diagnosis strategy. Especially, because the existing methods need massive redundancy iteration and repeated calculation for the state parameters of nodes, the resulting diagnosis strategy is often inefficient. To address this issue, a novel fast sequential fault diagnosis method is proposed. In this method, we present a new bottom-up search idea based on Karna...
Test pattern generation has progressed to a stage at which automatic test generation gives satisfact...
The performance of a fast fault simulation algorithm for combinational circuits, such as the critica...
With increase in complexity of digital circuits, it has become extremely important to detect faults ...
In this thesis, optimal and near-optimal algorithms are developed for various classes of single faul...
Sequential fault diagnosis is an approach that realizes fault isolation by executing the optimal tes...
Sequential fault diagnosis is an approach that realizes fault isolation by executing the optimal tes...
Abstract-The problem considered in this paper is that of gen- 1) Reducing the cost of applying the S...
We propose a new method to speed up stuck-at fault simulation for sequential circuits. The method co...
Sequential circuit test generation using deterministic, fault-oriented algorithms is highly complex ...
In this thesis, we develop effective techniques for system fault modeling and multiple fault diagnos...
Abstract—In this paper, we propose two fault-diagnosis meth-ods for improving multiple-fault diagnos...
A dynamic diagnosis scheme for synchronous sequential circuits is proposed. In contrast with schemes...
This dissertation describes a new simulation technique for an automatic test generation system, SCIR...
Abstract. Most algorithms for computing diagnoses within a model-based diagnosis framework are deter...
International audienceThis paper presents a logic diagnosis approach targeting sequential circuit pe...
Test pattern generation has progressed to a stage at which automatic test generation gives satisfact...
The performance of a fast fault simulation algorithm for combinational circuits, such as the critica...
With increase in complexity of digital circuits, it has become extremely important to detect faults ...
In this thesis, optimal and near-optimal algorithms are developed for various classes of single faul...
Sequential fault diagnosis is an approach that realizes fault isolation by executing the optimal tes...
Sequential fault diagnosis is an approach that realizes fault isolation by executing the optimal tes...
Abstract-The problem considered in this paper is that of gen- 1) Reducing the cost of applying the S...
We propose a new method to speed up stuck-at fault simulation for sequential circuits. The method co...
Sequential circuit test generation using deterministic, fault-oriented algorithms is highly complex ...
In this thesis, we develop effective techniques for system fault modeling and multiple fault diagnos...
Abstract—In this paper, we propose two fault-diagnosis meth-ods for improving multiple-fault diagnos...
A dynamic diagnosis scheme for synchronous sequential circuits is proposed. In contrast with schemes...
This dissertation describes a new simulation technique for an automatic test generation system, SCIR...
Abstract. Most algorithms for computing diagnoses within a model-based diagnosis framework are deter...
International audienceThis paper presents a logic diagnosis approach targeting sequential circuit pe...
Test pattern generation has progressed to a stage at which automatic test generation gives satisfact...
The performance of a fast fault simulation algorithm for combinational circuits, such as the critica...
With increase in complexity of digital circuits, it has become extremely important to detect faults ...