Sub-THz characterisation of multi-walled carbon nanotube thin films using vector network analyser

PUTHUKODAN, S.
DADRASNIA, E.
VINOD, V.K.T.
NGUENDON, H.K.
Lamela, H.
Ducournau, Guillaume
Lampin, Jean-Francois
Garet, F.
Coutaz, J.L.
Lee, D.M.
Baik, S.

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Publication date

January 2014

DOI

10.1049/el.2013.4136

Publisher

Institution of Engineering and Technology (IET)

Abstract

A vector network analyser is used to study the electrical properties of multi-walled carbon nanotube (MWCNT) thin films deposited on a fused quartz substrate in the sub-terahertz (THz) frequency ranges of 220-325 GHz (WR3.4) and 325-500 GHz (WR2.2). The experiment is performed in free space. The complex permittivity of the MWCNT thin films is extracted using the Nicholson-Ross-Weir method. The refractive index and conductivity are then determined from the extracted permittivity. The method is validated by comparison with values obtained using THz time-domain spectroscopy

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Sub-THz characterisation of multi-walled carbon nanotube thin films using vector network analyser

Abstract

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Sub-THz characterisation of multi-walled carbon nanotube thin films using vector network analyser

Abstract

Extracted data

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