©2003 American Institute of Physics. The electronic version of this article is the complete one and can be found online at: http://link.aip.org/link/?APPLAB/82/4806/1DOI:10.1063/1.1587878The mechanical resonance of a single ZnO nanobelt, induced by an alternative electric field, was studied by in situ transmission electron microscopy. Due to the rectangular cross section of the nanobelt, two fundamental resonance modes have been observed corresponding to two orthogonal transverse vibration directions, showing the versatile applications of nanobelts as nanocantilevers and nanoresonators. The bending modulus of the ZnO nanobelts was measured to be ~52 GPa and the damping time constant of the resonance in a vacuum of 5×10–8 Torr was ~1.2 ms an...
©2005 American Institute of Physics. The electronic version of this article is the complete one and ...
The electrical service behavior of ZnO nanowires (NWs) with various diameters was investigated by a ...
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA...
©2003 American Institute of Physics. The electronic version of this article is the complete one and ...
ZnO nanobelts are a group of quasi-one-dimensional nanostructures that have a unique rectangle-like ...
©2005 American Institute of Physics. The electronic version of this article is the complete one and ...
©2003 American Institute of Physics. The electronic version of this article is the complete one and ...
The Young’s modulus of ZnO nanobelts was measured with an atomic force microscope by means of the mo...
©2004 American Institute of Physics. The electronic version of this article is the complete one and ...
©2004 Microscopy Society of America. The electronic version of this article is the complete one and ...
We show how contact resonance atomic force microscopy (CR-AFM) can be used to accurately determine t...
We demonstrate the first electric field induced transverse deflection of a single-crystal, free-stan...
The Young’s modulus of ZnO nanobelts was measured using an atomic force microscope following the mod...
Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee,...
Piezoresponse force microscopy (PFM) is used to measure the effective piezoelectric coefficient (d33...
©2005 American Institute of Physics. The electronic version of this article is the complete one and ...
The electrical service behavior of ZnO nanowires (NWs) with various diameters was investigated by a ...
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA...
©2003 American Institute of Physics. The electronic version of this article is the complete one and ...
ZnO nanobelts are a group of quasi-one-dimensional nanostructures that have a unique rectangle-like ...
©2005 American Institute of Physics. The electronic version of this article is the complete one and ...
©2003 American Institute of Physics. The electronic version of this article is the complete one and ...
The Young’s modulus of ZnO nanobelts was measured with an atomic force microscope by means of the mo...
©2004 American Institute of Physics. The electronic version of this article is the complete one and ...
©2004 Microscopy Society of America. The electronic version of this article is the complete one and ...
We show how contact resonance atomic force microscopy (CR-AFM) can be used to accurately determine t...
We demonstrate the first electric field induced transverse deflection of a single-crystal, free-stan...
The Young’s modulus of ZnO nanobelts was measured using an atomic force microscope following the mod...
Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee,...
Piezoresponse force microscopy (PFM) is used to measure the effective piezoelectric coefficient (d33...
©2005 American Institute of Physics. The electronic version of this article is the complete one and ...
The electrical service behavior of ZnO nanowires (NWs) with various diameters was investigated by a ...
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA...