Debugging electronic circuits is traditionally done with bench equipment directly connected to the circuit under debug. In the digital domain, the difficulties associated with the direct physical access to circuit nodes led to the inclusion of resources providing support to that activity, first at the printed circuit level, and then at the integrated circuit level. The experience acquired with those solutions led to the emergence of dedicated infrastructures for debugging cores at the system-on-chip level. However, all these developments had a small impact in the analog and mixed-signal domain, where debugging still depends, to a large extent, on direct physical access to circuit nodes. As a consequence, when analog and mixed-signal circuit...
The IEEE 1149.4 Standard for a Mixed-Signal (MS) Test Bus proposes an extension to the well-accepte...
Abstract—To locate and correct design errors that escape pre-silicon verification, silicon debug has...
Electronic devices have come to permeate every aspect of our daily lives, and at the heart of each d...
Diagnosing design faults in a mixed-signals circuit is no trivial task, due to the inherent uncerta...
Debugging mixed-signal circuits is traditionally seen as a complex task due to the presence of an a...
Microprocessor-based systems are usually debugged with the help of in-circuit emulators and logic an...
The increasing complexity of VLSI circuits and the reduced accessibility of modern packaging and mou...
As the level of integrated circuit (IC) complexity continues to increase, the post-silicon validatio...
This document proposes an extension to the IEEE 1149.4 test infrastructure [1], whereby a bank of si...
With the advent of SOCs and SOPs, more functionalities are integrated into an IC or package. Higher ...
Recently, there has been a significant increase in design complexity for Embedded Systems often refe...
This paper presents an innovative application of IEEE 1149.4 and the integrated diagnostic reconfigu...
Microcontroller based applications are usually debugged with the assistance of In-circuit emulators...
Abstract—In multi-core designs, distributed embedded logic an-alyzers with multiple trigger units an...
textAs technology is advancing, larger and denser devices are being manufactured with shorter time ...
The IEEE 1149.4 Standard for a Mixed-Signal (MS) Test Bus proposes an extension to the well-accepte...
Abstract—To locate and correct design errors that escape pre-silicon verification, silicon debug has...
Electronic devices have come to permeate every aspect of our daily lives, and at the heart of each d...
Diagnosing design faults in a mixed-signals circuit is no trivial task, due to the inherent uncerta...
Debugging mixed-signal circuits is traditionally seen as a complex task due to the presence of an a...
Microprocessor-based systems are usually debugged with the help of in-circuit emulators and logic an...
The increasing complexity of VLSI circuits and the reduced accessibility of modern packaging and mou...
As the level of integrated circuit (IC) complexity continues to increase, the post-silicon validatio...
This document proposes an extension to the IEEE 1149.4 test infrastructure [1], whereby a bank of si...
With the advent of SOCs and SOPs, more functionalities are integrated into an IC or package. Higher ...
Recently, there has been a significant increase in design complexity for Embedded Systems often refe...
This paper presents an innovative application of IEEE 1149.4 and the integrated diagnostic reconfigu...
Microcontroller based applications are usually debugged with the assistance of In-circuit emulators...
Abstract—In multi-core designs, distributed embedded logic an-alyzers with multiple trigger units an...
textAs technology is advancing, larger and denser devices are being manufactured with shorter time ...
The IEEE 1149.4 Standard for a Mixed-Signal (MS) Test Bus proposes an extension to the well-accepte...
Abstract—To locate and correct design errors that escape pre-silicon verification, silicon debug has...
Electronic devices have come to permeate every aspect of our daily lives, and at the heart of each d...