Efficient Testing of High-Performance Data Converters Using Low-Cost Test Instrumentation.

Test strategies were developed to reduce the overall production testing cost of high-performance data converters. A static linearity testing methodology, aimed at reducing the test time of A/D converters, was developed. The architectural information of A/D converters was used, and specific codes were measured. To test a high-performance A/D converters using low-performance and low-cost test equipment a dynamic testing methodology was developed. This involved post processing of measurement data. The effect of ground bounce on accuracy of specification measurement was analyzed, and a test strategy to estimate the A/D converter specifications more accurately in presence of ground bounce noise was developed. The proposed test strategies were simulated using behavioral modeling techniques and were implemented on commercially available A/D converter devices. The hardware experiments validated the proposed test strategies. The test cost analysis was done. It suggest that a significant reduction in cost can be obtained by using the proposed test methodologies for data converter production testing.Ph.D.Committee Chair: Dr. Abhijit Chatterjee; Committee Member: Dr. Linda Milor; Committee Member: Dr. Magnus Egerstedt; Committee Member: Dr. Mike Atia; Committee Member: Dr. Sudhakar Yalamanchill