ISBN 2-84813-014-8Fault injection techniques have been used for a long time to evaluate the dependability of a given hardware, software or system implementation. The basic idea is to deliberately create faults into the environment under test after putting it into operation. The system under test is excited with application test vectors and data are collected on the outputs and also potentially on internal signals. At the end, these data can be used in order to analyse the behaviour of the system when faults occur.This work focuses on hardware-based fault injections, in digital circuits. In this context, it was proposed to take advantage of hardware prototyping to improve and accelerate the execution of the whole fault injection campaign. Re...
This paper proposes the use of parameterised FPGA configurations for a new test set generation appro...
This thesis focuses primarily on the evaluation of the functional effects of errors occurring in the...
Designers of safety-critical VLSI systems are asking for effective tools for evaluating and validati...
ISBN 2-84813-014-8Fault injection techniques have been used for a long time to evaluate the dependab...
International audienceIn this paper, approaches using run-time reconfiguration for fault injection i...
The probability of faults occurring in the field increases with the evolution of the CMOS technologi...
ISBN : 2-84813-092-XThe probability of transient faults increases with the evolution of the technolo...
The probability of faults occurring in the field increases with the evolution of the CMOS technologi...
ISBN : 2-84813-092-XThe probability of transient faults increases with the evolution of the technolo...
International audienceIn this paper, a new methodology for the injection of single event upsets (SEU...
ISBN 2-84813-044-XThe probability of transient faults increases with the evolution of technologies. ...
ISBN 2-84813-044-XThe probability of transient faults increases with the evolution of technologies. ...
ISBN: 0769507190In this paper, approaches using run-time reconfiguration (RTR) for fault injection i...
ISBN: 0769507190In this paper, approaches using run-time reconfiguration (RTR) for fault injection i...
Le travail présenté dans cette thèse entre dans la cadre des méthodes d'injection de fautes au nivea...
This paper proposes the use of parameterised FPGA configurations for a new test set generation appro...
This thesis focuses primarily on the evaluation of the functional effects of errors occurring in the...
Designers of safety-critical VLSI systems are asking for effective tools for evaluating and validati...
ISBN 2-84813-014-8Fault injection techniques have been used for a long time to evaluate the dependab...
International audienceIn this paper, approaches using run-time reconfiguration for fault injection i...
The probability of faults occurring in the field increases with the evolution of the CMOS technologi...
ISBN : 2-84813-092-XThe probability of transient faults increases with the evolution of the technolo...
The probability of faults occurring in the field increases with the evolution of the CMOS technologi...
ISBN : 2-84813-092-XThe probability of transient faults increases with the evolution of the technolo...
International audienceIn this paper, a new methodology for the injection of single event upsets (SEU...
ISBN 2-84813-044-XThe probability of transient faults increases with the evolution of technologies. ...
ISBN 2-84813-044-XThe probability of transient faults increases with the evolution of technologies. ...
ISBN: 0769507190In this paper, approaches using run-time reconfiguration (RTR) for fault injection i...
ISBN: 0769507190In this paper, approaches using run-time reconfiguration (RTR) for fault injection i...
Le travail présenté dans cette thèse entre dans la cadre des méthodes d'injection de fautes au nivea...
This paper proposes the use of parameterised FPGA configurations for a new test set generation appro...
This thesis focuses primarily on the evaluation of the functional effects of errors occurring in the...
Designers of safety-critical VLSI systems are asking for effective tools for evaluating and validati...