The Concurrent and Comparative Simulation (CCS) allows several simulations on a system in one single pass. One ofthe first applications of CCS has been the Concurrent Fault Simulation (CFS) for fault simulation in digital systems describedat the gate level. However, nowadays digital designers focus on more abstract languages such as VHDL (Very high speedintegrated circuits Hardware Description Language) rather than on these logical models. Modeling and simulating digitalcircuits behaviors is possible using these languages, but they do not allow the concurrent simulation of faulty behaviors, alsosimply called faults. Technical barriers for the design of a concurrent fault simulator are on the one hand the lack of realisticfault models and on ...
System level modeling is becoming a necessity in all areas of engineering design. As systems grow in...
Call number: LD2668 .T4 CMSC 1989 V67Master of ScienceComputing and Information Science
Call number: LD2668 .T4 CMSC 1989 V67Master of ScienceComputing and Information Science
Discrete event modeling allows designing an easy-to-handle and reusable represen-tation of a system ...
Les actions de recherche présentées entre dans le cadre de l'axe " Modélisation et conception des Sy...
The domain of fault simulation for digital circuits de-scribed at the RT-level is currently under he...
Elektronische Systeme sind in vielen Bereichen des täglichen Lebens zur Selbstverständlichkeit gewor...
Abstract — With the growing density of Very Large Scale Integrated(VLSI) circuits, traditional digit...
One of the main requirements for generating test patterns for analog and mixed-signal circuits is fa...
The growing size and complexity of VLSI circuits is creating a need for more efficient design automa...
© 2017 IEEE. Fault simulation is very important task for testing and fault diagnostics based on the ...
ISBN 2-913329-52-7The growing complexity of electronic systems stimulated by IC's technology progres...
Trace-based methods have been shown to be more effective than traditional fault simulation methods. ...
ISBN 2-913329-52-7The growing complexity of electronic systems stimulated by IC's technology progres...
ISBN 2-913329-52-7The growing complexity of electronic systems stimulated by IC's technology progres...
System level modeling is becoming a necessity in all areas of engineering design. As systems grow in...
Call number: LD2668 .T4 CMSC 1989 V67Master of ScienceComputing and Information Science
Call number: LD2668 .T4 CMSC 1989 V67Master of ScienceComputing and Information Science
Discrete event modeling allows designing an easy-to-handle and reusable represen-tation of a system ...
Les actions de recherche présentées entre dans le cadre de l'axe " Modélisation et conception des Sy...
The domain of fault simulation for digital circuits de-scribed at the RT-level is currently under he...
Elektronische Systeme sind in vielen Bereichen des täglichen Lebens zur Selbstverständlichkeit gewor...
Abstract — With the growing density of Very Large Scale Integrated(VLSI) circuits, traditional digit...
One of the main requirements for generating test patterns for analog and mixed-signal circuits is fa...
The growing size and complexity of VLSI circuits is creating a need for more efficient design automa...
© 2017 IEEE. Fault simulation is very important task for testing and fault diagnostics based on the ...
ISBN 2-913329-52-7The growing complexity of electronic systems stimulated by IC's technology progres...
Trace-based methods have been shown to be more effective than traditional fault simulation methods. ...
ISBN 2-913329-52-7The growing complexity of electronic systems stimulated by IC's technology progres...
ISBN 2-913329-52-7The growing complexity of electronic systems stimulated by IC's technology progres...
System level modeling is becoming a necessity in all areas of engineering design. As systems grow in...
Call number: LD2668 .T4 CMSC 1989 V67Master of ScienceComputing and Information Science
Call number: LD2668 .T4 CMSC 1989 V67Master of ScienceComputing and Information Science