This thesis is a contribution at the architectural level to the improvement of fault-tolerance in massively defective multi-core chips fabricated using nanometer transistors. The main idea of this work is that a chip should be organized in a replicated architecture and become as autonomous as possible to increase its resilience against both permanent defects and transient faults occurring at runtime. Therefore, we introduce a new chip self-configuration methodology, which allows detecting and isolating the defective cores, deactivating the isolated cores, configuring the communications and managing the allocation and execution of tasks. The efficiency of the methods is studied as a function of the fraction of defective cores, of defective i...
Abstract — We propose a built-in self-test (BIST) procedure for nanofabrics implemented using chemic...
The new generations of SRAM-based FPGAdevices, built on nanometer technology, are thepreferred choic...
In future nanotechnologies failure densities are predicted to be several orders of magnitude higher ...
This thesis is a contribution at the architectural level to the improvement of fault-tolerance in ma...
Cette thèse est une contribution au niveau architectural à l amélioration de la tolérance aux fautes...
ISBN 978-1-4244-4596-7International audienceAs we move deeper in the nanotechnology era, computer ar...
Scaling of transistor's channel length is entering the realm of atomic and molecular geometries maki...
Divers domaines d'application des systèmes électroniques, comme par exemple les implants médicaux ou...
The perspective of nanometric technologies foreshadows the advent of processors consisting of hundre...
Nanoscale processor designs pose new challenges not encountered in the world of conventional CMOS de...
Abstract—Nanoscale processor designs pose new challenges not encountered in the world of conventiona...
This paper focuses on the investigation of efficient methods to evaluate circuit fault-tolerance. We...
This paper focuses on the investigation of efficient methods to evaluate circuit fault-tolerance. We...
Nanoelectronics, promising significant boosts in device density, power and performance, has been pro...
La perspective de technologies nanométriques permet d'envisager l'avènement de processeurs constitué...
Abstract — We propose a built-in self-test (BIST) procedure for nanofabrics implemented using chemic...
The new generations of SRAM-based FPGAdevices, built on nanometer technology, are thepreferred choic...
In future nanotechnologies failure densities are predicted to be several orders of magnitude higher ...
This thesis is a contribution at the architectural level to the improvement of fault-tolerance in ma...
Cette thèse est une contribution au niveau architectural à l amélioration de la tolérance aux fautes...
ISBN 978-1-4244-4596-7International audienceAs we move deeper in the nanotechnology era, computer ar...
Scaling of transistor's channel length is entering the realm of atomic and molecular geometries maki...
Divers domaines d'application des systèmes électroniques, comme par exemple les implants médicaux ou...
The perspective of nanometric technologies foreshadows the advent of processors consisting of hundre...
Nanoscale processor designs pose new challenges not encountered in the world of conventional CMOS de...
Abstract—Nanoscale processor designs pose new challenges not encountered in the world of conventiona...
This paper focuses on the investigation of efficient methods to evaluate circuit fault-tolerance. We...
This paper focuses on the investigation of efficient methods to evaluate circuit fault-tolerance. We...
Nanoelectronics, promising significant boosts in device density, power and performance, has been pro...
La perspective de technologies nanométriques permet d'envisager l'avènement de processeurs constitué...
Abstract — We propose a built-in self-test (BIST) procedure for nanofabrics implemented using chemic...
The new generations of SRAM-based FPGAdevices, built on nanometer technology, are thepreferred choic...
In future nanotechnologies failure densities are predicted to be several orders of magnitude higher ...