This thesis addresses the issue of mixed-signal board test in maintenance stage. Numerous test methods and test tools have been developed mainly for the test of circuits at design and production stages in hardware test. Surprisingly, one may notice that little interest has been placed into testing during the maintenance stage. However, some systems, like military systems for example, need to be maintained in operational conditions for decades. It is therefore important to ensure that the boards' functionalities of such systems do not deteriorate over time. Should a board become faulty, diagnosis help is then useful to fix it. We propose a functional test methodology which suits the maintenance context. This methodology allows functional mod...
The growing complexity of modern chips poses challenging test problems due to the requirement for sp...
The role of nano-electronic systems is rapidly expanding in every facet of modern life. Testing the ...
Today's Integrated Circuits are made of millions of transistors, Printed Circuit Boards (PCBs) can h...
Le problème abordé dans cette thèse concerne le test de cartes mixtes en maintenance. Dans le domain...
We present an ongoing work in the domain of mixed-signal board maintenance testing, supported by an ...
International audienceIn this paper, we present in the context of mixed-signal board maintenance tes...
In the context of maintenance and diagnosis of faulty boards, we introduce a functional FSM-based mo...
International audienceWe present an ongoing work in the domain of mixed-signal board maintenance tes...
International audienceIn the context of maintenance testing and diagnosis of faulty boards, a functi...
International audienceIn the context of maintenance testing and diagnosis of faulty boards, a functi...
In the context of maintenance testing and diagnosis of faulty boards, a functional FSM (Finite State...
National audienceThe constant increase in the integration level of microelectronics technologies mak...
The share of test in the cost of design and manufacture of integrated circuits continues to grow, he...
The growing complexity of modern chips poses challenging test problems due to the requirement for sp...
The role of nano-electronic systems is rapidly expanding in every facet of modern life. Testing the ...
Today's Integrated Circuits are made of millions of transistors, Printed Circuit Boards (PCBs) can h...
Le problème abordé dans cette thèse concerne le test de cartes mixtes en maintenance. Dans le domain...
We present an ongoing work in the domain of mixed-signal board maintenance testing, supported by an ...
International audienceIn this paper, we present in the context of mixed-signal board maintenance tes...
In the context of maintenance and diagnosis of faulty boards, we introduce a functional FSM-based mo...
International audienceWe present an ongoing work in the domain of mixed-signal board maintenance tes...
International audienceIn the context of maintenance testing and diagnosis of faulty boards, a functi...
International audienceIn the context of maintenance testing and diagnosis of faulty boards, a functi...
In the context of maintenance testing and diagnosis of faulty boards, a functional FSM (Finite State...
National audienceThe constant increase in the integration level of microelectronics technologies mak...
The share of test in the cost of design and manufacture of integrated circuits continues to grow, he...
The growing complexity of modern chips poses challenging test problems due to the requirement for sp...
The role of nano-electronic systems is rapidly expanding in every facet of modern life. Testing the ...
Today's Integrated Circuits are made of millions of transistors, Printed Circuit Boards (PCBs) can h...