We use a microscope combining atomic force microscopy (AFM) and scanning tunneling microscopy (STM) at very low temperature (~100 mK) to study mesoscopic nanocircuits. To perform AFM measurements, we use quartz tuning forks covered with metallic electrodes on which we glue the tip. By using the tuning fork as a dynamic force sensor, we can localize the sample. Then, switching off the oscillation, we can perform local spectroscopies along the conductive part. We use platinum-iridium coated tips to measure the local density of states. This work is focused on hybrid Josephson junctions composed of a normal metal (copper) island of approximately 1 µm separating two superconductors (aluminium). These samples are made by electronic lithography an...
In this work, we study how the conductance of a mesoscopic-scale normal metal circuit is modified by...
La physique mésoscopique est actuellement dominée par des mesures de transport permettant d'extraire...
Nous avons développé un microscope versatile combinant microscopie de force (AFM) et microscopie à e...
We use a microscope combining atomic force microscopy (AFM) and scanning tunneling microscopy (STM) ...
Nous utilisons un microscope combinant microscopie à force atomique (AFM) et microscopie à effet tun...
We describe proximity effects in hybrid junctions made of a superconductor and a normal metal (N-S j...
We describe proximity effects in hybrid junctions made of a superconductor and a normal metal (N-S j...
Electronic spectroscopy based on electron tunneling gives access to the electronic Density of States...
We have developed a combined microscope Atomic Force Microscope (AFM) / Scanning Tunneling Microscop...
Electronic spectroscopy based on electron tunneling gives access to the electronic density of states...
Electronic spectroscopy based on electron tunneling gives access to the electronic density of states...
We study electronic effects of coherence that appear at very low temperature in non homogeneous supe...
We study electronic effects of coherence that appear at very low temperature in non homogeneous supe...
4 pagesInternational audienceWe demonstrate the combination of scanning force microscopy and scannin...
In this work, we study how the conductance of a mesoscopic-scale normal metal circuit is modified by...
In this work, we study how the conductance of a mesoscopic-scale normal metal circuit is modified by...
La physique mésoscopique est actuellement dominée par des mesures de transport permettant d'extraire...
Nous avons développé un microscope versatile combinant microscopie de force (AFM) et microscopie à e...
We use a microscope combining atomic force microscopy (AFM) and scanning tunneling microscopy (STM) ...
Nous utilisons un microscope combinant microscopie à force atomique (AFM) et microscopie à effet tun...
We describe proximity effects in hybrid junctions made of a superconductor and a normal metal (N-S j...
We describe proximity effects in hybrid junctions made of a superconductor and a normal metal (N-S j...
Electronic spectroscopy based on electron tunneling gives access to the electronic Density of States...
We have developed a combined microscope Atomic Force Microscope (AFM) / Scanning Tunneling Microscop...
Electronic spectroscopy based on electron tunneling gives access to the electronic density of states...
Electronic spectroscopy based on electron tunneling gives access to the electronic density of states...
We study electronic effects of coherence that appear at very low temperature in non homogeneous supe...
We study electronic effects of coherence that appear at very low temperature in non homogeneous supe...
4 pagesInternational audienceWe demonstrate the combination of scanning force microscopy and scannin...
In this work, we study how the conductance of a mesoscopic-scale normal metal circuit is modified by...
In this work, we study how the conductance of a mesoscopic-scale normal metal circuit is modified by...
La physique mésoscopique est actuellement dominée par des mesures de transport permettant d'extraire...
Nous avons développé un microscope versatile combinant microscopie de force (AFM) et microscopie à e...