New low power solutions for Very Large Scale Integration (VLSI) are proposed. Especially, we focus on leakage power reduction. Although neglected at 0.18u technology and above, leakage power is nearly equal to dynamic power consumption in nanoscale technology, e.g., 0.07u. We present a novel circuit structure, we call it sleepy stack, which is a combination of two well-known low-leakage techniques: the forced stack and sleep transistor techniques. Unlike the forced stack technique, the sleepy stack technique can utilize high-Vth transistors without incurring a large delay increase. Also, unlike the sleep transistor technique, the sleepy stack technique can retain exact logic state while achieving similar leakage power savings. In short, o...
Abstract—Recent studies show that peripheral circuit (including decoders, wordline drivers, input an...
On-chip L1 and L2 caches dissipate a sizeable fraction of the total power of processors. As feature ...
Leakage power is a growing concern in modern technology nodes. In some current and emerging applicat...
Abstract—For the most recent CMOS feature sizes (e.g., 90nm and 65nm), leakage power dissipation has...
Leakage power consumption of current CMOS technology is already a great challenge. ITRS projects tha...
Abstract — This paper proposes a new topology to low power approaches for very large scale integrati...
The integrated circuit design has important role of various parameters are considering for design th...
For the most recent CMOS feature sizes (e.g., 90nm and 65nm), leakage power dissipation has become a...
Scaling of CMOS technology has enabled a phenomenal growth in computing capability throughout the la...
Leakage power loss is a major concern in deep-submicron technologies. High-performance processors an...
This technical report elaborates on the methodology and findings presented in “Sleepy Stack Reductio...
Leakage power has become a serious concern in nanometer CMOS technologies and is a very important is...
<div>Static power consumption is a major concern in nanometre technologies. Along with technology sc...
Power optimization has become an important factor in designing a VLSI circuit. Earlier dynamic power...
This paper deals with proposal of a new dual stack approach for reducing both leakage and dynamic po...
Abstract—Recent studies show that peripheral circuit (including decoders, wordline drivers, input an...
On-chip L1 and L2 caches dissipate a sizeable fraction of the total power of processors. As feature ...
Leakage power is a growing concern in modern technology nodes. In some current and emerging applicat...
Abstract—For the most recent CMOS feature sizes (e.g., 90nm and 65nm), leakage power dissipation has...
Leakage power consumption of current CMOS technology is already a great challenge. ITRS projects tha...
Abstract — This paper proposes a new topology to low power approaches for very large scale integrati...
The integrated circuit design has important role of various parameters are considering for design th...
For the most recent CMOS feature sizes (e.g., 90nm and 65nm), leakage power dissipation has become a...
Scaling of CMOS technology has enabled a phenomenal growth in computing capability throughout the la...
Leakage power loss is a major concern in deep-submicron technologies. High-performance processors an...
This technical report elaborates on the methodology and findings presented in “Sleepy Stack Reductio...
Leakage power has become a serious concern in nanometer CMOS technologies and is a very important is...
<div>Static power consumption is a major concern in nanometre technologies. Along with technology sc...
Power optimization has become an important factor in designing a VLSI circuit. Earlier dynamic power...
This paper deals with proposal of a new dual stack approach for reducing both leakage and dynamic po...
Abstract—Recent studies show that peripheral circuit (including decoders, wordline drivers, input an...
On-chip L1 and L2 caches dissipate a sizeable fraction of the total power of processors. As feature ...
Leakage power is a growing concern in modern technology nodes. In some current and emerging applicat...