IEEE Catalog Number: CFP15449-ART (XPLORE) ISBN: 978-1-5090-0232-0 (XPLORE)IEEE Catalog Number: CFP15449-CDR (CD-ROM) ISBN: 978-1-5090-0230-6 (CD-ROM)IEEE Catalog Number: CFP15449-PRT (PRINT) ISBN: 978-1-5090-0231-3 (PRINT)International audienceThe purpose of this paper is to evaluate the SEU sensitivity of a multi-core SoC working in two different multiprocessing modes. Radiation ground tests were performed with 14 MeV neutrons in GENEPI2 facility. The case study was a 45nm SOI multi-core processor having implemented error correcting code (ECC) and parity in their cache memories
This paper presents a SEU sensitivity characterization at ultra-low bias voltage of three generation...
Les phénomènes de dégradation induits par les radiations sont parmi ceux qui contribuent le plus à d...
IEEE Catalog Number: CFP15449-ART (XPLORE) ISBN: 978-1-5090-0232-0 (XPLORE) IEEE Catalog Number: CFP...
IEEE Catalog Number: CFP15449-ART (XPLORE) ISBN: 978-1-5090-0232-0 (XPLORE)IEEE Catalog Number: CFP1...
The aim of this work is to evaluate the SEE sensitivity of a multi-core processor having implemented...
International audienceThis work evaluates the SEE static and dynamic sensitivityof a single-chip man...
The present thesis aims at evaluating the SEE static and dynamic sensitivity of three different COTS...
Abstract–Graphics Processing Units specifically designed for High Performance Computing applications...
The present work assesses the radiation sensitivity of an affordable and performant COTS multicore p...
La présente thèse vise à évaluer la sensibilité statique et dynamique face aux SEE de trois disposit...
International audienceThis work evaluates the error-rate of a memorybound application implemented in...
This work describes a comparative radiation reliability analysis between two reconfigurable devices ...
This paper presents a SEU sensitivity characterization at ultra-low bias voltage of three generation...
Les phénomènes de dégradation induits par les radiations sont parmi ceux qui contribuent le plus à d...
IEEE Catalog Number: CFP15449-ART (XPLORE) ISBN: 978-1-5090-0232-0 (XPLORE) IEEE Catalog Number: CFP...
IEEE Catalog Number: CFP15449-ART (XPLORE) ISBN: 978-1-5090-0232-0 (XPLORE)IEEE Catalog Number: CFP1...
The aim of this work is to evaluate the SEE sensitivity of a multi-core processor having implemented...
International audienceThis work evaluates the SEE static and dynamic sensitivityof a single-chip man...
The present thesis aims at evaluating the SEE static and dynamic sensitivity of three different COTS...
Abstract–Graphics Processing Units specifically designed for High Performance Computing applications...
The present work assesses the radiation sensitivity of an affordable and performant COTS multicore p...
La présente thèse vise à évaluer la sensibilité statique et dynamique face aux SEE de trois disposit...
International audienceThis work evaluates the error-rate of a memorybound application implemented in...
This work describes a comparative radiation reliability analysis between two reconfigurable devices ...
This paper presents a SEU sensitivity characterization at ultra-low bias voltage of three generation...
Les phénomènes de dégradation induits par les radiations sont parmi ceux qui contribuent le plus à d...
IEEE Catalog Number: CFP15449-ART (XPLORE) ISBN: 978-1-5090-0232-0 (XPLORE) IEEE Catalog Number: CFP...