Statistical anomalies of bitflips in SRAMS to discriminate MCUS SEUS
- Clemente, J.A.
- Franco, F.J.
- Villa, Francesca
- Baylac, Maud
- Rey, Solenne
- Mecha, H.
- Agapito, J.A.
- Puchner, Helmut
- Hubert, G.
- Velazco, Raoul
DOIAbstract
IEEE Catalog Number: CFP15449-ART (XPLORE) ISBN: 978-1-5090-0232-0 (XPLORE) IEEE Catalog Number: CFP15449-CDR (CD-ROM) ISBN: 978-1-5090-0230-6 (CD-ROM) IEEE Catalog Number: CFP15449-PRT (PRINT) ISBN: 978-1-5090-0231-3 (PRINT)International audienceThis paper presentes an approach to discern MCUs from SEUs in SRAM memories. Experiments involving radiation tests with 14-MeV neutrons on two successive generations (130 and 90 nm) of Cypress devices are presented
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