One of the major sources of error in planar PIV is due to particle intensity variations when e.g. particles with out-of-plane motion change their intensity or disappear completely. The same effect comes e.g. from different laser beam profiles for the first and second laser pulse or from non-spherical rotating particles changing reflectivity. It has been shown that the error due to this effect can be as large as 0.05 to 0.1 pixel for typical out-of-plane displacements. The paper introduces a method to suppress the influence of this error source based on selective pixel weighting using local correlation values over a 3×3 pixel area. The method has been applied to synthetic data and a moving glass block with markers. In most cases a substantia...
The effect of independent variations of the intensity of individual tracer particles between consecu...
Planar Nephelometry is a laser-based technique capable of providing instantaneous planar local numbe...
Micro-PIV (?PIV) uses volume-illumination and imaging of fluorescent tracer particles through a sing...
One of the major sources of error in planar PIV is due to particle intensity variations when e.g. pa...
One of the major sources of error in planar PIV is due to particle intensity variations when e.g. pa...
A non-post-interrogation method of reducing sub-pixel bias errors and eliminating spurious vectors f...
Individual variations of intensity of tracer particles, e.g., due to out-of-plane displacements betw...
Individual variations of intensity of tracer particles, e.g., due to out-of-plane displacements betw...
Individual variations of intensity of tracer particles, e.g., due to out-of-plane displacements betw...
Individual variations of intensity of tracer particles, e.g. due to out-of-plane displacements betwe...
Individual variations of intensity of tracer particles, e.g. due to out-of-plane displacements betwe...
Abstract: Pixel locking in stereoscopic particle image velocimetry (SPIV) is often overlooked, albei...
In PIV, the systematic tendency of the measured sub-pixel displacement to be biased towards the inte...
The effect of independent variations of the intensity of individual tracer particles between consecu...
The effect of independent variations of the intensity of individual tracer particles between consecu...
The effect of independent variations of the intensity of individual tracer particles between consecu...
Planar Nephelometry is a laser-based technique capable of providing instantaneous planar local numbe...
Micro-PIV (?PIV) uses volume-illumination and imaging of fluorescent tracer particles through a sing...
One of the major sources of error in planar PIV is due to particle intensity variations when e.g. pa...
One of the major sources of error in planar PIV is due to particle intensity variations when e.g. pa...
A non-post-interrogation method of reducing sub-pixel bias errors and eliminating spurious vectors f...
Individual variations of intensity of tracer particles, e.g., due to out-of-plane displacements betw...
Individual variations of intensity of tracer particles, e.g., due to out-of-plane displacements betw...
Individual variations of intensity of tracer particles, e.g., due to out-of-plane displacements betw...
Individual variations of intensity of tracer particles, e.g. due to out-of-plane displacements betwe...
Individual variations of intensity of tracer particles, e.g. due to out-of-plane displacements betwe...
Abstract: Pixel locking in stereoscopic particle image velocimetry (SPIV) is often overlooked, albei...
In PIV, the systematic tendency of the measured sub-pixel displacement to be biased towards the inte...
The effect of independent variations of the intensity of individual tracer particles between consecu...
The effect of independent variations of the intensity of individual tracer particles between consecu...
The effect of independent variations of the intensity of individual tracer particles between consecu...
Planar Nephelometry is a laser-based technique capable of providing instantaneous planar local numbe...
Micro-PIV (?PIV) uses volume-illumination and imaging of fluorescent tracer particles through a sing...