Reliability is becoming a major design concern in contemporary microprocessors since soft error rate is increasing due to technology scaling. Therefore, design time system vulnerability estimation is of paramount importance. Architectural Vulnerability Factor (AVF) is an early vulnerability estimation methodology. However, AVF considers that the value of a bit in a clock cycle is either required for Architecturally Correct Execution (i.e. ACE-bit) or not (i.e. unACE-bit); therefore, AVF cannot distinguish the vulnerability impact level of an ACE-bit. In this study, we present a new dimension which takes into account the vulnerability impact level of a bit. We introduce Bit Impact Factor metric which, we believe, will be helpful for extendin...
With shrinking process technology, the primary cause of transient faults in semiconductors shifts aw...
sign complexity and technology scaling, soft errors have become a key design challenge. In this work...
Early reliability assessment of hardware structures using microarchitecture level simulators can eff...
Reliability is becoming a major design concern in contemporary microprocessors since soft error rate...
Üretim teknolojisinin ilerlemesi ile birlikte mikroişlemcilerde kullanılan transistörlerin boyutları...
Abstract-The notion of Architectural Vulnerability Factor (AVF) has been extensively used to evaluat...
Soft error reliability has become a first-order design criterion for modern microprocessors. Archite...
Reliability to soft errors is a significant design challenge in modern microprocessors owing to an e...
Abstract—Reliability is an important design constraint in modern microprocessors, and one of the fun...
Single-event upsets from particle strikes have become a key challenge in microprocessor design. Tech...
To face future reliability challenges, it is necessary to quantify the risk of error in any part of ...
Abstract—Soft Errors have emerged as a key challenge to microprocessor design. Traditional soft erro...
Aggressive technology scaling is increasing the impact of soft errors on microprocessor reliability....
Research has shown that microprocessors and structures of the microprocessors are vulnerable to alph...
The shrinking processor feature size, lower threshold voltage and increasing clock frequency make mo...
With shrinking process technology, the primary cause of transient faults in semiconductors shifts aw...
sign complexity and technology scaling, soft errors have become a key design challenge. In this work...
Early reliability assessment of hardware structures using microarchitecture level simulators can eff...
Reliability is becoming a major design concern in contemporary microprocessors since soft error rate...
Üretim teknolojisinin ilerlemesi ile birlikte mikroişlemcilerde kullanılan transistörlerin boyutları...
Abstract-The notion of Architectural Vulnerability Factor (AVF) has been extensively used to evaluat...
Soft error reliability has become a first-order design criterion for modern microprocessors. Archite...
Reliability to soft errors is a significant design challenge in modern microprocessors owing to an e...
Abstract—Reliability is an important design constraint in modern microprocessors, and one of the fun...
Single-event upsets from particle strikes have become a key challenge in microprocessor design. Tech...
To face future reliability challenges, it is necessary to quantify the risk of error in any part of ...
Abstract—Soft Errors have emerged as a key challenge to microprocessor design. Traditional soft erro...
Aggressive technology scaling is increasing the impact of soft errors on microprocessor reliability....
Research has shown that microprocessors and structures of the microprocessors are vulnerable to alph...
The shrinking processor feature size, lower threshold voltage and increasing clock frequency make mo...
With shrinking process technology, the primary cause of transient faults in semiconductors shifts aw...
sign complexity and technology scaling, soft errors have become a key design challenge. In this work...
Early reliability assessment of hardware structures using microarchitecture level simulators can eff...