This work deals with COMBO2 card interconnect and memory devices testing. In the beginning of the paper, some existing testing algorithms for interconnect and RAM memories testing are introduced. This work is devoted to proposal of generic architecture for interconnect and memory devices testing. The proposed architecture is optimized for FPGA implementation
This paper deals with the key issues encountered in testing during the development of high-speed net...
Abstract Fault detection and diagnosis of a Field‐Programmable Gate Array (FPGA) in a short period i...
While techniques for offline testing of FPGAs, either manufacturing-oriented or application-oriented...
This work deals with design and implementation of a methodology for testing RAM memories connected t...
[[abstract]]The paper presents a prototype re-configurable tester for memory chips. The new tester c...
The design and implementation of a PCI Express (PCIe) Field-Programmable Gate Array (FPGA) memory fu...
Abstract — In this paper we discuss the popular testing techniques for reconfigurable FPGAs. For the...
In this paper we consider testing for programmable interconnect structures of look-up table based FP...
Since Field programmable gate arrays (FPGAs) are reprogrammable, faults in them can be easily toleru...
International audienceThis paper presents a BIST scheme for a new hierarchical interconnect topology...
The development of IC integration technologies leads to an extensive use of memories and buffers in ...
Due to the character of the original source materials and the nature of batch digitization, quality ...
In this thesis, we study the problem of faults in modern semiconductor memory structures and their t...
This paper presents a novel build-in-self-test (BIST) manufacture-oriented interconnect test strateg...
Abstract—As IC densities are increasing, cluster-based field programmable gate arrays (FPGA) archite...
This paper deals with the key issues encountered in testing during the development of high-speed net...
Abstract Fault detection and diagnosis of a Field‐Programmable Gate Array (FPGA) in a short period i...
While techniques for offline testing of FPGAs, either manufacturing-oriented or application-oriented...
This work deals with design and implementation of a methodology for testing RAM memories connected t...
[[abstract]]The paper presents a prototype re-configurable tester for memory chips. The new tester c...
The design and implementation of a PCI Express (PCIe) Field-Programmable Gate Array (FPGA) memory fu...
Abstract — In this paper we discuss the popular testing techniques for reconfigurable FPGAs. For the...
In this paper we consider testing for programmable interconnect structures of look-up table based FP...
Since Field programmable gate arrays (FPGAs) are reprogrammable, faults in them can be easily toleru...
International audienceThis paper presents a BIST scheme for a new hierarchical interconnect topology...
The development of IC integration technologies leads to an extensive use of memories and buffers in ...
Due to the character of the original source materials and the nature of batch digitization, quality ...
In this thesis, we study the problem of faults in modern semiconductor memory structures and their t...
This paper presents a novel build-in-self-test (BIST) manufacture-oriented interconnect test strateg...
Abstract—As IC densities are increasing, cluster-based field programmable gate arrays (FPGA) archite...
This paper deals with the key issues encountered in testing during the development of high-speed net...
Abstract Fault detection and diagnosis of a Field‐Programmable Gate Array (FPGA) in a short period i...
While techniques for offline testing of FPGAs, either manufacturing-oriented or application-oriented...