The goal of this thesis is to describe the possibility of using a microscope for documentation defects and innovation of electrical machines. I used an electron microscope to document carbon brushes and nanomaterials for possible upgrade of the sliding contact. Use microscopes gives us detailed information about the structure of materials, at the largest stress of the electrical machine. Based on the collected data can be further analyzed and innovation of the carbon brush
This article, the final one of a series on the design of electrostatic electron microscopes, contain...
This thesis deals with description of the microscopic techniques that are used to analyse materials....
Modern scanning electron microscopes (SEM) are equipped with a very sophisticated detection system t...
This work deals with the use of the light microscope in industry and its use within the automatizati...
Abstract. 2014 At first, a brief historical sketch of the development of in-situ experiments in elec...
Scanning electron microscopy (SEM) represents a powerful tool for studying spatial structures in con...
Traditionally,electron microscopes are mainly used to characterize structures while electron beam da...
The author describes briefly the application of a new technique of electron microscopy to the proble...
Electrical discharges in accelerating structures are one of the key issues limiting the performance ...
Scanning electron microscopy (SEM) is the most preferred method in microstructural analysis today. I...
A trial construction of a scanning exoelectron emission microscope (SEEM) was carried out. Some obse...
During the last 5 years, the semi-conductor industry has enhanced device performances by scaling do...
Many special techniques have been developed in electron microscopy. Electron tomograpy is used to ge...
The use of the electron microscope as a powerful instrument in the study of crystal structure, collo...
Some applications of high voltage electron microscope (HVEM) at Hitachi are reviewed. Accompanied by...
This article, the final one of a series on the design of electrostatic electron microscopes, contain...
This thesis deals with description of the microscopic techniques that are used to analyse materials....
Modern scanning electron microscopes (SEM) are equipped with a very sophisticated detection system t...
This work deals with the use of the light microscope in industry and its use within the automatizati...
Abstract. 2014 At first, a brief historical sketch of the development of in-situ experiments in elec...
Scanning electron microscopy (SEM) represents a powerful tool for studying spatial structures in con...
Traditionally,electron microscopes are mainly used to characterize structures while electron beam da...
The author describes briefly the application of a new technique of electron microscopy to the proble...
Electrical discharges in accelerating structures are one of the key issues limiting the performance ...
Scanning electron microscopy (SEM) is the most preferred method in microstructural analysis today. I...
A trial construction of a scanning exoelectron emission microscope (SEEM) was carried out. Some obse...
During the last 5 years, the semi-conductor industry has enhanced device performances by scaling do...
Many special techniques have been developed in electron microscopy. Electron tomograpy is used to ge...
The use of the electron microscope as a powerful instrument in the study of crystal structure, collo...
Some applications of high voltage electron microscope (HVEM) at Hitachi are reviewed. Accompanied by...
This article, the final one of a series on the design of electrostatic electron microscopes, contain...
This thesis deals with description of the microscopic techniques that are used to analyse materials....
Modern scanning electron microscopes (SEM) are equipped with a very sophisticated detection system t...