Study of thin films refractive index by interference microscopy

This bachelor thesis is focused to measure of spectral dependences of refractive index in thin layers. The object of this thesis was measurement of dispersion dependences of refractive index. The theoretical part deals with present methods of refractive index measurements and quantities associated with. These methods were ordered from the easiest to the most complex methods. Intention of own work was reached results by the very easy method of interference mi-croscopy. Thin layers of various organic matters were investigated by optical microscope and main-ly by interference microscope to determine their optical attributes – refractive index and his dis-persion dependences. There were images, which were made by interference microscope and digital camera. These images were subjected to image analysis by computer program HarFA. Dispersion dependences of refractive index were proved by elaboration by this computer pro-gram