The dark-field image obtained in grating-based x-ray phase-contrast imaging can provide information about the objects' microstructures on a scale smaller than the pixel size even with low geometric magnification. In this publication we demonstrate that the dark-field image quality can be enhanced with an energy-resolving pixel detector. Energy-resolved x-ray dark-field images were acquired with a 16-energy-channel photon-counting pixel detector with a 1 mm thick CdTe sensor in a Talbot-Lau x-ray interferometer. A method for contrast-noise-ratio (CNR) enhancement is proposed and validated experimentally. In measurements, a CNR improvement by a factor of 1.14 was obtained. This is equivalent to a possible radiation dose reduction of 23%
Abstract Edge illumination (EI) X-ray phase-contrast imaging (XPCI) has potential for applications ...
Abstract Material-selective analysis of spectral X-ray imaging data requires prior knowledge of the ...
[[abstract]]We have demonstrated dark-field imaging using a full-field hard x-ray microscope by usin...
The dark-field image obtained in grating-based x-ray phase-contrast imaging can provide information ...
Grating-based differential phase-contrast imaging has proven to be feasible with conventional X-ray ...
10siGrating-based differential phase-contrast imaging has proven to be feasible with conventional X-...
Imaging with visible light today uses numerous contrast mechanisms, including bright- and dark-field...
A novel information retrieval algorithm for X-ray grating-based phase-contrast imaging based on the ...
X-ray imaging has been boosted by the introduction of phase-based methods. Detail visibility is enha...
Grating-based X-ray dark-field contrast is an emerging new imaging modality that is demonstrating pa...
Very early, in 1896, Wilhelm Conrad Röntgen, the founding father of X-rays, attempted to measur...
Although x-ray imaging is widely used in biomedical applications, biological soft tissues have small...
Over the recent years X-ray differential phase-contrast imaging was developed for the hard X-ray reg...
X-ray imaging has conventionally relied upon attenuation to provide contrast. In recent years, two c...
X-ray backlighters allow the capture of sharp images of fast dynamic processes due to extremely shor...
Abstract Edge illumination (EI) X-ray phase-contrast imaging (XPCI) has potential for applications ...
Abstract Material-selective analysis of spectral X-ray imaging data requires prior knowledge of the ...
[[abstract]]We have demonstrated dark-field imaging using a full-field hard x-ray microscope by usin...
The dark-field image obtained in grating-based x-ray phase-contrast imaging can provide information ...
Grating-based differential phase-contrast imaging has proven to be feasible with conventional X-ray ...
10siGrating-based differential phase-contrast imaging has proven to be feasible with conventional X-...
Imaging with visible light today uses numerous contrast mechanisms, including bright- and dark-field...
A novel information retrieval algorithm for X-ray grating-based phase-contrast imaging based on the ...
X-ray imaging has been boosted by the introduction of phase-based methods. Detail visibility is enha...
Grating-based X-ray dark-field contrast is an emerging new imaging modality that is demonstrating pa...
Very early, in 1896, Wilhelm Conrad Röntgen, the founding father of X-rays, attempted to measur...
Although x-ray imaging is widely used in biomedical applications, biological soft tissues have small...
Over the recent years X-ray differential phase-contrast imaging was developed for the hard X-ray reg...
X-ray imaging has conventionally relied upon attenuation to provide contrast. In recent years, two c...
X-ray backlighters allow the capture of sharp images of fast dynamic processes due to extremely shor...
Abstract Edge illumination (EI) X-ray phase-contrast imaging (XPCI) has potential for applications ...
Abstract Material-selective analysis of spectral X-ray imaging data requires prior knowledge of the ...
[[abstract]]We have demonstrated dark-field imaging using a full-field hard x-ray microscope by usin...