Metrological Characterization of an Ultra-low Noise Acquisition System for Fast Voltage Pulses Measurements

The metrological characterization of a custom designed ultra-low noise analogue front-end for an acquisition system for the measurement of flat-top of fast voltage pulses is presented. The system has challenging r quirements, in particular for Common Mode Rejection Ratio (C M RR), thus custom methods have been defined, by illustrating the experimental results achieved at the European Organization for Nuclear Research (CERN) during the study of the new Compact LInear Collider (CLIC)