A monolithic multi-channel analog transient recorder, implemented using switched capacitor sample-and-hold circuits and a high-speed analogically-adjustable delay-line-based write clock, has been designed, fabricated and tested. The 2.1 by 6.9 mm layout, in 1.2 micron CMOS, includes over 31,000 transistors and 2048 double polysilicon capacitors. The circuit contains four parallel channels, each with a 512 deep switched-capacitor sample-and-hold system. A 512 deep edge sensitive tapped active delay line uses look-ahead and 16 way interleaving to develop the 512 sample and hold clocks, each as little as 3.2 ns wide and 200 ps apart. Measurements of the device have demonstrated 5 GHz maximum sample rate, at least 350 MHz bandwidth, an extrapol...
The new tester for the measurement of the propagation delay times in high-speed IC logic by the use ...
The new tester for the measurement of the propagation delay times in high-speed digital IC by the us...
In the paper we present the design and test resultsof an integrated circuit combining a sample & hol...
Switched capacitor analog memories are well suited to a number of applications where a continuous di...
Switched capacitor analog memories are well suited to a number of applications where a continuous di...
The design and performance of a multi-G-sample/s fully-synchronous analog transient waveform recorde...
The design and performance of a fully-synchronous multi-GHz analog transient waveform recorder I.C. ...
Switched-capacitor analog memories are well-suited to a number of applications where a continuous di...
We present a switched-capacitor readout system for high speed analog signals. It consists of a 10 MH...
The performance demonstrated by a one gigasample per second (1 Gs/s) transient recorder currently in...
Abstract—An area-efficient and robust integrated test core for mixed-signal circuits is described. T...
This article describes the most recent generation of full-custom analog integrated circuit that is i...
As the electronics industry moves forward there is an increasing need to process information faster ...
A number of particle astrophysics initiatives to exploit radio emission from high energy particle ca...
This article describes a full-custom analog integrated circuit that is intended for low-power, high-...
The new tester for the measurement of the propagation delay times in high-speed IC logic by the use ...
The new tester for the measurement of the propagation delay times in high-speed digital IC by the us...
In the paper we present the design and test resultsof an integrated circuit combining a sample & hol...
Switched capacitor analog memories are well suited to a number of applications where a continuous di...
Switched capacitor analog memories are well suited to a number of applications where a continuous di...
The design and performance of a multi-G-sample/s fully-synchronous analog transient waveform recorde...
The design and performance of a fully-synchronous multi-GHz analog transient waveform recorder I.C. ...
Switched-capacitor analog memories are well-suited to a number of applications where a continuous di...
We present a switched-capacitor readout system for high speed analog signals. It consists of a 10 MH...
The performance demonstrated by a one gigasample per second (1 Gs/s) transient recorder currently in...
Abstract—An area-efficient and robust integrated test core for mixed-signal circuits is described. T...
This article describes the most recent generation of full-custom analog integrated circuit that is i...
As the electronics industry moves forward there is an increasing need to process information faster ...
A number of particle astrophysics initiatives to exploit radio emission from high energy particle ca...
This article describes a full-custom analog integrated circuit that is intended for low-power, high-...
The new tester for the measurement of the propagation delay times in high-speed IC logic by the use ...
The new tester for the measurement of the propagation delay times in high-speed digital IC by the us...
In the paper we present the design and test resultsof an integrated circuit combining a sample & hol...