This book provides a unified treatment of Flip-Flop design and selection in nanometer CMOS VLSI systems. The design aspects related to the energy-delay tradeoff in Flip-Flops are discussed, including their energy-optimal selection according to the targeted application, and the detailed circuit design in nanometer CMOS VLSI systems. Design strategies are derived in a coherent framework that includes explicitly nanometer effects, including leakage, layout parasitics and process/voltage/temperature variations, as main advances over the existing body of work in the field. The related design tradeoffs are explored in a wide range of applications and the related energy-performance targets. A wide range of existing and recently proposed Flip-Flop ...
In this paper, a comparison of the most representative flip-flop (FF) topologies in a 65-nm CMOS tec...
In this paper, a comparison of the most representative flip-flop (FF) topologies in a 65-nm CMOS tec...
In this paper, split into Part I and II, the impact of variations on single-edge triggered flip-flop...
In this paper (split into Part I and II), an extensive comparison of existing flip-flop (FF) classes...
In this paper (split into Part I and II), an extensive comparison of existing flip-flop (FF) classes...
In this paper (split into Part I and II), an extensive comparison of existing flip-flop (FF) classes...
In this paper (split into Part I and II), an extensive comparison of existing flip-flop (FF) classes...
In this Part II of the paper, a comparison of the most representative flip-flop (FF) classes and top...
In this Part II of the paper, a comparison of the most representative flip-flop (FF) classes and top...
In this paper, a general and complete design flow for nanometer flip-flops (FFs) is presented. The p...
In this Part II of the paper, a comparison of the most representative flip-flop (FF) classes and top...
In this paper, a general and complete design flow for nanometer flip-flops (FFs) is presented. The p...
In this Part II of the paper, a comparison of the most representative flip-flop (FF) classes and top...
In this paper, a general and complete design flow for nanometer flip-flops (FFs) is presented. The p...
In this paper, a comparison of the most representative flip-flop (FF) topologies in a 65-nm CMOS tec...
In this paper, a comparison of the most representative flip-flop (FF) topologies in a 65-nm CMOS tec...
In this paper, a comparison of the most representative flip-flop (FF) topologies in a 65-nm CMOS tec...
In this paper, split into Part I and II, the impact of variations on single-edge triggered flip-flop...
In this paper (split into Part I and II), an extensive comparison of existing flip-flop (FF) classes...
In this paper (split into Part I and II), an extensive comparison of existing flip-flop (FF) classes...
In this paper (split into Part I and II), an extensive comparison of existing flip-flop (FF) classes...
In this paper (split into Part I and II), an extensive comparison of existing flip-flop (FF) classes...
In this Part II of the paper, a comparison of the most representative flip-flop (FF) classes and top...
In this Part II of the paper, a comparison of the most representative flip-flop (FF) classes and top...
In this paper, a general and complete design flow for nanometer flip-flops (FFs) is presented. The p...
In this Part II of the paper, a comparison of the most representative flip-flop (FF) classes and top...
In this paper, a general and complete design flow for nanometer flip-flops (FFs) is presented. The p...
In this Part II of the paper, a comparison of the most representative flip-flop (FF) classes and top...
In this paper, a general and complete design flow for nanometer flip-flops (FFs) is presented. The p...
In this paper, a comparison of the most representative flip-flop (FF) topologies in a 65-nm CMOS tec...
In this paper, a comparison of the most representative flip-flop (FF) topologies in a 65-nm CMOS tec...
In this paper, a comparison of the most representative flip-flop (FF) topologies in a 65-nm CMOS tec...
In this paper, split into Part I and II, the impact of variations on single-edge triggered flip-flop...