As soon as the first particles emerge from an ion source, the source characteristics need to be determined. The total beam intensity, the transverse particle distributions, the beam divergence and emittance as well as the longitudinal parameters of the beam must be measured. This chapter provides an overview of typical measurement methods and the instruments used, and shows the results obtained
These lectures aim at describing instruments and methods used for measuring beam parameters in circu...
Stable and uniform beams with low divergence are required in particle accelerators; therefore, beyon...
The new test-bench for heavy ion sources has been created in ITEP. It is planned to equip test-bench...
Ion sources produce beams used in accelerators and other applications. Both development and use of i...
These lectures aim to describe instruments and methods used for measuring beam parameters in particl...
Beam diagnostics and instrumentation are an essential part of any kind of accelerator. There is a la...
Advanced diagnostic tools for high brightness electron beams are mandatory for the proper optimizati...
Advanced diagnostic tools for high brightness electron beams are mandatory for the proper optimizati...
Advanced diagnostic tools for high brightness electron beams are mandatory for the proper optimizati...
Advanced diagnostic tools for high brightness electron beams are mandatory for the proper optimizati...
A visual diagnostic technique has been developed to monitor and study ion-beam structure, shape, and...
A correlation method of nonperturbative con-trol on the ion energy spectrum, beam profile and transv...
The determination of the beam emittance using conventional destructive methods suffers from two main...
Many particle diagnostics are active techniques based on the injection of a beam of neutral atoms or...
The emittance of an extracted ion beam can be estimated to first order by a series of three linear i...
These lectures aim at describing instruments and methods used for measuring beam parameters in circu...
Stable and uniform beams with low divergence are required in particle accelerators; therefore, beyon...
The new test-bench for heavy ion sources has been created in ITEP. It is planned to equip test-bench...
Ion sources produce beams used in accelerators and other applications. Both development and use of i...
These lectures aim to describe instruments and methods used for measuring beam parameters in particl...
Beam diagnostics and instrumentation are an essential part of any kind of accelerator. There is a la...
Advanced diagnostic tools for high brightness electron beams are mandatory for the proper optimizati...
Advanced diagnostic tools for high brightness electron beams are mandatory for the proper optimizati...
Advanced diagnostic tools for high brightness electron beams are mandatory for the proper optimizati...
Advanced diagnostic tools for high brightness electron beams are mandatory for the proper optimizati...
A visual diagnostic technique has been developed to monitor and study ion-beam structure, shape, and...
A correlation method of nonperturbative con-trol on the ion energy spectrum, beam profile and transv...
The determination of the beam emittance using conventional destructive methods suffers from two main...
Many particle diagnostics are active techniques based on the injection of a beam of neutral atoms or...
The emittance of an extracted ion beam can be estimated to first order by a series of three linear i...
These lectures aim at describing instruments and methods used for measuring beam parameters in circu...
Stable and uniform beams with low divergence are required in particle accelerators; therefore, beyon...
The new test-bench for heavy ion sources has been created in ITEP. It is planned to equip test-bench...
DOI
Add to ORKG