This paper reports a study towards enhancing the throughput of the Atomic Force Microscope (AFM) tip-based nanomachining process by increasing the cutting speed at the interface between the tool and the workpiece. A modified AFM set-up was implemented, which combined the fast reciprocating motions of a piezoelectric actuator, on which the workpiece was mounted, and the linear displacement of the AFM stage, which defined the length of produced grooves. The influence of the feed, the feed direction and the cutting speed on the machined depth and on the chip formation was studied in detail when machining poly(methyl methacrylate). A theoretical cutting speed over 5 m/min could be achieved with this set-up when the frequency of the piezoelectri...
Recent research investigations have reported the benefit of enhancing conventional AFM-based nanosca...
In recent years, the atomic force microscope (AFM) has become an important tool in nanotechnology re...
The effect of the tip bluntness of AFM probes on their effective rake angle during AFM-based nanosca...
This paper reports a study towards enhancing the throughput of the Atomic Force Microscope (AFM) tip...
Atomic Force Microscopy (AFM) machining, where the tip of the AFM probe is employed as a cutting too...
<p>As an alternative to well-established nano-lithographic methods, mechanical manufacturing methods...
This paper presents a novel mechanical material removal method to produce nanostructures with a prec...
Atomic force microscope (AFM) tip-based nanomachining is currently the object of intense research in...
We present experimental and theoretical results to describe and explain processing outcomes when pro...
A novel method relying on atomic force microscope (AFM) tip based nanomachining is presented to enab...
Nanotechnology is the branch of science which deals with the manipulation of matters at an extremely...
In the last two decades, technological progress towards the miniaturisation of products and componen...
This paper presents a feasibility study, which aims to demonstrate the applicability of the CNC auto...
Thesis: Ph. D., Massachusetts Institute of Technology, Department of Mechanical Engineering, 2015.Ca...
This research is focused on improving the mechatronic design and control strategies of Atomic Force ...
Recent research investigations have reported the benefit of enhancing conventional AFM-based nanosca...
In recent years, the atomic force microscope (AFM) has become an important tool in nanotechnology re...
The effect of the tip bluntness of AFM probes on their effective rake angle during AFM-based nanosca...
This paper reports a study towards enhancing the throughput of the Atomic Force Microscope (AFM) tip...
Atomic Force Microscopy (AFM) machining, where the tip of the AFM probe is employed as a cutting too...
<p>As an alternative to well-established nano-lithographic methods, mechanical manufacturing methods...
This paper presents a novel mechanical material removal method to produce nanostructures with a prec...
Atomic force microscope (AFM) tip-based nanomachining is currently the object of intense research in...
We present experimental and theoretical results to describe and explain processing outcomes when pro...
A novel method relying on atomic force microscope (AFM) tip based nanomachining is presented to enab...
Nanotechnology is the branch of science which deals with the manipulation of matters at an extremely...
In the last two decades, technological progress towards the miniaturisation of products and componen...
This paper presents a feasibility study, which aims to demonstrate the applicability of the CNC auto...
Thesis: Ph. D., Massachusetts Institute of Technology, Department of Mechanical Engineering, 2015.Ca...
This research is focused on improving the mechatronic design and control strategies of Atomic Force ...
Recent research investigations have reported the benefit of enhancing conventional AFM-based nanosca...
In recent years, the atomic force microscope (AFM) has become an important tool in nanotechnology re...
The effect of the tip bluntness of AFM probes on their effective rake angle during AFM-based nanosca...