Conference PaperWe study the problem of designing support vector classifiers with respect to a Neyman-Pearson criterion. Specifically, given a user-specified level alpha, 0 < alpha < 1, how can we ensure a false alarm rate no greater than a while minimizing the miss rate? We examine two approaches, one based on shifting the offset of a conventionally trained SVM and the other based on the introduction of class-specific weights. Our contributions include a novel heuristic for improved error estimation and a strategy for efficiently searching the parameter space of the second method. We also provide a characterization of the feasible parameter set of the 2nu-SVM on which the second approach is based. The proposed methods are compared on four ...
A crucial issue in designing learning machines is to select the correct model parameters. When the n...
International audienceThe issue of large scale binary classification when data is subject to random ...
© Copyright 2001 IEEESupport vector machines (SVMs) have been successfully applied to classification...
In binary classification there are two types of errors, and in many applications these may have very...
This paper studies the training of support vector machine (SVM) classifiers with respect to the mini...
We study the problem of designing support vector machine (SVM) classifiers that minimize the maximu...
Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)Conselho Nacional de Desenvolvimento Ci...
Abstract—The Support Vector Machines (SVMs) have been widely used for classification due to its abil...
This paper investigates a new learning model in which the input data is corrupted with noise. We pre...
We find very tight bounds on the accuracy of a Support Vector Machine classification error within th...
International audienceMany one class SVM applications require online learning technique when time se...
In some applications, the probability of error of a given classifier is too high for its practical a...
In some applications, the probability of error of a given classifier is too high for its practical a...
© 2017 Elsevier B.V. A post-processing technique for Support Vector Machine (SVM) algorithms for bin...
Support vector machines (SVMs) constitute one of the most popular and powerful classification method...
A crucial issue in designing learning machines is to select the correct model parameters. When the n...
International audienceThe issue of large scale binary classification when data is subject to random ...
© Copyright 2001 IEEESupport vector machines (SVMs) have been successfully applied to classification...
In binary classification there are two types of errors, and in many applications these may have very...
This paper studies the training of support vector machine (SVM) classifiers with respect to the mini...
We study the problem of designing support vector machine (SVM) classifiers that minimize the maximu...
Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)Conselho Nacional de Desenvolvimento Ci...
Abstract—The Support Vector Machines (SVMs) have been widely used for classification due to its abil...
This paper investigates a new learning model in which the input data is corrupted with noise. We pre...
We find very tight bounds on the accuracy of a Support Vector Machine classification error within th...
International audienceMany one class SVM applications require online learning technique when time se...
In some applications, the probability of error of a given classifier is too high for its practical a...
In some applications, the probability of error of a given classifier is too high for its practical a...
© 2017 Elsevier B.V. A post-processing technique for Support Vector Machine (SVM) algorithms for bin...
Support vector machines (SVMs) constitute one of the most popular and powerful classification method...
A crucial issue in designing learning machines is to select the correct model parameters. When the n...
International audienceThe issue of large scale binary classification when data is subject to random ...
© Copyright 2001 IEEESupport vector machines (SVMs) have been successfully applied to classification...