This book presents the development and experimental validation of the structural test strategy called Oscillation-Based Test - OBT in short. The results presented here assert, not only from a theoretical point of view, but also based on a wide experimental support, that OBT is an efficient defect-oriented test solution, complementing the existing functional test techniques for mixed-signal circuits
Testing switched capacitor circuits is a challenge due to the diversity of the possible faults. A sp...
xi, 92 leaves : ill. ; 30 cm.PolyU Library Call No.: [THS] LG51 .H577M EIE 2001 GorlaDue to the rapi...
This paper presents a discussion on several methods that can be used to improve the testability of m...
This paper describes a test method for analog and mixed signal device at very low cost and it‟s base...
This paper describes a testing method to analyze analog and mixed signal device based on oscillation...
Testing is a critical factor for modern large-scale mixed-mode circuits. Strategies for mitigating t...
Testing is a critical factor for modern large-scale mixed-mode circuits. Strategies for mitigating t...
Testing is a critical factor for modern large-scale mixed-mode circuits. Strategies for mitigating t...
Testing is a critical factor for modern large-scale mixed-mode circuits. Strategies for mitigating t...
Testing is a critical factor for modern large-scale mixed-mode circuits. Strategies for mitigating t...
Testing is a critical factor for modern large-scale mixed-mode circuits. Strategies for mitigating t...
Comunicación presentada al "The First IEEE International Workshop on Electronic Design, Test and App...
A formal set of design decisions can aid in using oscillation-based test (OBT) for analog subsystems...
The present thesis attempts to develop new techniques for testing analog parts of embedded cores-bas...
This work presents a simple and low-cost method for on-chip evaluation of test signals coming from t...
Testing switched capacitor circuits is a challenge due to the diversity of the possible faults. A sp...
xi, 92 leaves : ill. ; 30 cm.PolyU Library Call No.: [THS] LG51 .H577M EIE 2001 GorlaDue to the rapi...
This paper presents a discussion on several methods that can be used to improve the testability of m...
This paper describes a test method for analog and mixed signal device at very low cost and it‟s base...
This paper describes a testing method to analyze analog and mixed signal device based on oscillation...
Testing is a critical factor for modern large-scale mixed-mode circuits. Strategies for mitigating t...
Testing is a critical factor for modern large-scale mixed-mode circuits. Strategies for mitigating t...
Testing is a critical factor for modern large-scale mixed-mode circuits. Strategies for mitigating t...
Testing is a critical factor for modern large-scale mixed-mode circuits. Strategies for mitigating t...
Testing is a critical factor for modern large-scale mixed-mode circuits. Strategies for mitigating t...
Testing is a critical factor for modern large-scale mixed-mode circuits. Strategies for mitigating t...
Comunicación presentada al "The First IEEE International Workshop on Electronic Design, Test and App...
A formal set of design decisions can aid in using oscillation-based test (OBT) for analog subsystems...
The present thesis attempts to develop new techniques for testing analog parts of embedded cores-bas...
This work presents a simple and low-cost method for on-chip evaluation of test signals coming from t...
Testing switched capacitor circuits is a challenge due to the diversity of the possible faults. A sp...
xi, 92 leaves : ill. ; 30 cm.PolyU Library Call No.: [THS] LG51 .H577M EIE 2001 GorlaDue to the rapi...
This paper presents a discussion on several methods that can be used to improve the testability of m...