This paper describes how fault injection has been implemented as a test method for an FPGA in an existing hardware configuration setup. As this FPGA is in charge of data readout for a large tracking detector, the reliability of this FPGA is of high importance. Due to the complexity of the readout electronics, irradiation testing is technically difficult at this stage of the system commissioning. The work presented in this paper is therefore motivated by introducing fault injection as an alternative method to characterize failures caused by SEUs. It is a method to study the effect that a configuration upset may have on the operation of the FPGA. The target platform consists of two independent modules for data acquisition and detector control...
SRAM based reprogrammable FPGAs are sensitive to radiation-induced Single Event Upsets (SEU), not on...
Since Field programmable gate arrays (FPGAs) are reprogrammable, faults in them can be easily tolera...
International audienceSingle Event Upset (SEU) phenomena is becoming a major concern in applications...
International audienceA new method for injecting faults in the configuration bits of SRAM-based FPGA...
Fault injection through partial dynamic reconfiguration can simulate upsets in configuration memory ...
A method of detecting faults for evaluating the fault cross section of any field programmable gate a...
International audienceIn this paper, a new methodology for the injection of single event upsets (SEU...
Abstract In modern VLSI, widespread deployment of on-line test technology has become crucial. In thi...
The paper presents the extent of fault effects in FPGA based systems and concentrates on transient f...
FPGA-based fault injection methods have recently become more popular since they provide high speed i...
FPGA-based fault injection methods have recently become more popular since they provide high speed i...
This thesis describes a technology and methodology designed and developed for the study of certain a...
Abstract. Designers of safety-critical VLSI systems are asking for effective tools for evaluating an...
Designers of safety-critical VLSI systems are asking for effective tools for evaluating and validati...
SRAM-Based FPGAs are widely employed in space and avionics computing. The unfriendly environment and...
SRAM based reprogrammable FPGAs are sensitive to radiation-induced Single Event Upsets (SEU), not on...
Since Field programmable gate arrays (FPGAs) are reprogrammable, faults in them can be easily tolera...
International audienceSingle Event Upset (SEU) phenomena is becoming a major concern in applications...
International audienceA new method for injecting faults in the configuration bits of SRAM-based FPGA...
Fault injection through partial dynamic reconfiguration can simulate upsets in configuration memory ...
A method of detecting faults for evaluating the fault cross section of any field programmable gate a...
International audienceIn this paper, a new methodology for the injection of single event upsets (SEU...
Abstract In modern VLSI, widespread deployment of on-line test technology has become crucial. In thi...
The paper presents the extent of fault effects in FPGA based systems and concentrates on transient f...
FPGA-based fault injection methods have recently become more popular since they provide high speed i...
FPGA-based fault injection methods have recently become more popular since they provide high speed i...
This thesis describes a technology and methodology designed and developed for the study of certain a...
Abstract. Designers of safety-critical VLSI systems are asking for effective tools for evaluating an...
Designers of safety-critical VLSI systems are asking for effective tools for evaluating and validati...
SRAM-Based FPGAs are widely employed in space and avionics computing. The unfriendly environment and...
SRAM based reprogrammable FPGAs are sensitive to radiation-induced Single Event Upsets (SEU), not on...
Since Field programmable gate arrays (FPGAs) are reprogrammable, faults in them can be easily tolera...
International audienceSingle Event Upset (SEU) phenomena is becoming a major concern in applications...