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Ultralow-Temperature Measurements of Submicron Devices

Kastner, Marc A.
Field, S.
Licini, C.
Face, D.
Meirav, U.
Scott-Thomas, John H. F.
Park, S.

Publication date

January 1987

Publisher

Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)

Abstract

Contains research summary.Joint Services Electronics Program (Contract DAALO03-86-K-0002

Extracted data

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