Developmental Electron Optics Laboratory

The Formation and Utility of Sub-Angstrom to Nanometer-Sized Electron Probes in the Aberration-Corrected Transmission Electron Microscope at the University of Illinois

Wen, Jianguo
Mabon, James
Lei, Changhui
Burdin, Steve
Sammann, Ernie
Petrov, Ivan
Shah, Arnish B.
Chobpattana, Varistha
Zhang, Jiong
Ran, Ke
Zuo, Jian-Min
Mishina, Satoshi
Aoki, Toshihiro

January 2010

We evaluate the probe forming capability of a JEOL 2200FS transmission electron microscope equipped ...

Microchemical surface analysis by electron spectroscopy

July 1971

Auger electron velocity analyzer for use with scanning electron microscope to identify low concentra...

History of Electron Microscopy at the Institute of Scientific Instruments

Müllerová, Ilona

January 2014

The development of the first transmission electron microscope (EM) at the Institute of Scientific In...

Electron Optics

King, John G.
Coleman, John W.

July 1974

Contains reports on one research project.Joint Services Electronics Program (Contract DAAB07-71-C-03...

Developmental Electron Optics Laboratory

Coleman, John W.

January 1980

Contains report on one research project.Joint Services Electronics Program (Contract DAAG29-78-C-002...

Developmental Electron Optics Laboratory

Coleman, John W.

January 1978

Contains reports on one research project.Joint Services Electronics Program (Contract DAAB07-76-C-14...

Developmental Electron Optics Laboratory

Coleman, John W.

January 1981

Contains report on one research project.National Institutes of Health (Grant 1 R01 GM23597)M.I.T. Sl...

Electron Optics

Graham, Michael R.
Coleman, John W.

January 1976

Contains research objectives and summary of research on one research project.Joint Services Electron...

Electron Optics

King, J. G.

January 1974

Contains research objectives and summary of research.Joint Services Electronics Program (Contract DA...

Electron Materials Analysis by Auger Electron Microscope (AEM)

Coleman, John W.
Graham, Michael R.

January 1977

Contains research objectives and summary of research on one research project.Joint Services Electron...

Electron Optics

King, John G.
Coleman, John W.
Wittels, Norman D.
Jacobsen, Edward H.

January 1975

Contains research objectives, summary of research on one research project, and reports on two resear...

Electron Optics

Coleman, John W.
Dylla, H. Frederick
Silver, Bruce R.

July 1975

Contains reports on one research project.Joint Services Electronics Program (Contract DAAB07-74-C-06...

Construction of an Auger Microscope

Soulen, Charles

May 2019

This thesis describes the design, adaptations and characterizations necessary to partially turn an A...

Prospects for Photo Electron Spectroscopy in a Scanning Transmission Electron Microscope

Pijper, F. J.
Bleeker, A. J.
Endert, R. J.
Kruit, P.

March 1989

High spatial resolution microanalysis in scanning transmission electron microscopes is most easily p...

Prospects for Photo Electron Spectroscopy in a Scanning Transmission Electron Microscope

Pijper, F. J.
Bleeker, A. J.
Endert, R. J.
Kruit, P.

March 1989

High spatial resolution microanalysis in scanning transmission electron microscopes is most easily p...

The Formation and Utility of Sub-Angstrom to Nanometer-Sized Electron Probes in the Aberration-Corrected Transmission Electron Microscope at the University of Illinois

Wen, Jianguo
Mabon, James
Lei, Changhui
Burdin, Steve
Sammann, Ernie
Petrov, Ivan
Shah, Arnish B.
Chobpattana, Varistha
Zhang, Jiong
Ran, Ke
Zuo, Jian-Min
Mishina, Satoshi
Aoki, Toshihiro

January 2010

We evaluate the probe forming capability of a JEOL 2200FS transmission electron microscope equipped ...

Microchemical surface analysis by electron spectroscopy

July 1971

Auger electron velocity analyzer for use with scanning electron microscope to identify low concentra...

History of Electron Microscopy at the Institute of Scientific Instruments

Müllerová, Ilona

January 2014

The development of the first transmission electron microscope (EM) at the Institute of Scientific In...

Electron Optics

King, John G.
Coleman, John W.

July 1974

Contains reports on one research project.Joint Services Electronics Program (Contract DAAB07-71-C-03...

Developmental Electron Optics Laboratory

Coleman, John W.

January 1980

Contains report on one research project.Joint Services Electronics Program (Contract DAAG29-78-C-002...

Developmental Electron Optics Laboratory

Coleman, John W.

January 1978

Contains reports on one research project.Joint Services Electronics Program (Contract DAAB07-76-C-14...

Developmental Electron Optics Laboratory

Coleman, John W.

January 1981

Contains report on one research project.National Institutes of Health (Grant 1 R01 GM23597)M.I.T. Sl...

Electron Optics

Graham, Michael R.
Coleman, John W.

January 1976

Contains research objectives and summary of research on one research project.Joint Services Electron...

Electron Optics

King, J. G.

January 1974

Contains research objectives and summary of research.Joint Services Electronics Program (Contract DA...

Electron Materials Analysis by Auger Electron Microscope (AEM)

Coleman, John W.
Graham, Michael R.

January 1977

Contains research objectives and summary of research on one research project.Joint Services Electron...

Electron Optics

King, John G.
Coleman, John W.
Wittels, Norman D.
Jacobsen, Edward H.

January 1975

Contains research objectives, summary of research on one research project, and reports on two resear...

Electron Optics

Coleman, John W.
Dylla, H. Frederick
Silver, Bruce R.

July 1975

Contains reports on one research project.Joint Services Electronics Program (Contract DAAB07-74-C-06...

Construction of an Auger Microscope

Soulen, Charles

May 2019

This thesis describes the design, adaptations and characterizations necessary to partially turn an A...

Prospects for Photo Electron Spectroscopy in a Scanning Transmission Electron Microscope

Pijper, F. J.
Bleeker, A. J.
Endert, R. J.
Kruit, P.

March 1989

High spatial resolution microanalysis in scanning transmission electron microscopes is most easily p...

Prospects for Photo Electron Spectroscopy in a Scanning Transmission Electron Microscope

Pijper, F. J.
Bleeker, A. J.
Endert, R. J.
Kruit, P.

March 1989

High spatial resolution microanalysis in scanning transmission electron microscopes is most easily p...

The Formation and Utility of Sub-Angstrom to Nanometer-Sized Electron Probes in the Aberration-Corrected Transmission Electron Microscope at the University of Illinois

Wen, Jianguo
Mabon, James
Lei, Changhui
Burdin, Steve
Sammann, Ernie
Petrov, Ivan
Shah, Arnish B.
Chobpattana, Varistha
Zhang, Jiong
Ran, Ke
Zuo, Jian-Min
Mishina, Satoshi
Aoki, Toshihiro

January 2010

We evaluate the probe forming capability of a JEOL 2200FS transmission electron microscope equipped ...

Microchemical surface analysis by electron spectroscopy

July 1971

Auger electron velocity analyzer for use with scanning electron microscope to identify low concentra...

History of Electron Microscopy at the Institute of Scientific Instruments

Müllerová, Ilona

January 2014

The development of the first transmission electron microscope (EM) at the Institute of Scientific In...

Developmental Electron Optics Laboratory

Abstract

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Developmental Electron Optics Laboratory

Abstract

Extracted data

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