In practices, most industrial products are subject to sudden failure and only failure information can be collected, which presents a great challenge for reliability prediction of modern devices. To address this issue, our paper proposes a dynamic reliability estimation and control for industrial products under regular failure trials. The failure trial is performed at different operational time points of the products, which provides sole data source for evaluating the status of industrial products. We use Bayesian approach to dynamically estimate the industrial products when the failure trial is available. The estimated reliability is updated using a point estimate with new available data. To maintain the reliability of products at a desirab...
During the development of a new car model the manufacturer usually has to redesign subassemblies in ...
The different ways of industrial reliability testing and the aims and goals of a product r...
Over the years many advancing techniques in the area of reliability engineering have surfaced in the...
This paper provides a methodology to determine the reliability of a system, when only limited inform...
Over the last few decades, reliability analysis has attracted significant interest due to its import...
International audienceThe reliability of products can be affected by the quality errors which may oc...
Abstract: The aim is to develop a more simple and effective method's performance and dynamic reliabi...
International audienceThis paper presents a general methodology to improve risk assessment in the sp...
The paper describes a reliability prediction methodology that may be used to evaluate the reliabilit...
The increased system complexity in electronic products brings challenges in a system level reliabili...
A latent failure mode is a type of failure that may not occur until the system has operated in the f...
Semiconductor Industry (SI) is facing the challenge of short product life cycles due to increasing d...
International audienceThis paper proposes an estimation method for the confidence level of feedback ...
Abstract: New repairable systems are generally subjected to development programs in order to improv...
The Bayes' theorem is applied for reliability parameters estimation, control and testing alternative...
During the development of a new car model the manufacturer usually has to redesign subassemblies in ...
The different ways of industrial reliability testing and the aims and goals of a product r...
Over the years many advancing techniques in the area of reliability engineering have surfaced in the...
This paper provides a methodology to determine the reliability of a system, when only limited inform...
Over the last few decades, reliability analysis has attracted significant interest due to its import...
International audienceThe reliability of products can be affected by the quality errors which may oc...
Abstract: The aim is to develop a more simple and effective method's performance and dynamic reliabi...
International audienceThis paper presents a general methodology to improve risk assessment in the sp...
The paper describes a reliability prediction methodology that may be used to evaluate the reliabilit...
The increased system complexity in electronic products brings challenges in a system level reliabili...
A latent failure mode is a type of failure that may not occur until the system has operated in the f...
Semiconductor Industry (SI) is facing the challenge of short product life cycles due to increasing d...
International audienceThis paper proposes an estimation method for the confidence level of feedback ...
Abstract: New repairable systems are generally subjected to development programs in order to improv...
The Bayes' theorem is applied for reliability parameters estimation, control and testing alternative...
During the development of a new car model the manufacturer usually has to redesign subassemblies in ...
The different ways of industrial reliability testing and the aims and goals of a product r...
Over the years many advancing techniques in the area of reliability engineering have surfaced in the...